Qun LIU

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Wuxi New District, Jiangsu, CN

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Patents Grantslast 30 patents

Information Patent Grant
Structure and method for testing semiconductor device
- Patent number 10,816,589
- Issue date Oct 27, 2020
- CSMC Technologies Fab2 Co., Ltd.
- Xiaobing Ren
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FORMING METHOD FOR FLOATING CONTACT HOLE, AND SEMICONDUCTOR DEVICE
- Publication number 20240290846
- Publication date Aug 29, 2024
- CSMC TECHNOLOGIES FAB2 CO., LTD.
- Qun LIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE AND METHOD FOR TESTING SEMICONDUCTOR DEVICE
- Publication number 20190346500
- Publication date Nov 14, 2019
- CSMC TECHNOLOGIES FAB2 CO., LTD.
- Xiaobing REN
- G01 - MEASURING TESTING