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Rachel Eisenhower
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Karlsruhe, DE
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Patents Grants
last 30 patents
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Patent Grant
X-ray reflectometry system with multiple sample holder and individu...
Patent number
7,746,980
Issue date
Jun 29, 2010
Bruker Axs GmbH
Rolf-Dieter Schipper
G01 - MEASURING TESTING
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Patent Grant
Analysis device with variably illuminated strip detector
Patent number
7,263,161
Issue date
Aug 28, 2007
Bruker Axs GmbH
Ekkehard Gerndt
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
X-RAY REFLECTOMETRY SYSTEM WITH MULTIPLE SAMPLE HOLDER AND INDIVIDU...
Publication number
20100150310
Publication date
Jun 17, 2010
Bruker AXS GmbH
Rolf-Dieter Schipper
G01 - MEASURING TESTING
Information
Patent Application
Analysis device with variably illuminated strip detector
Publication number
20060083350
Publication date
Apr 20, 2006
Bruker AXS GmbH
Ekkehard Gerndt
G01 - MEASURING TESTING