Rachel Yie Fang Wai

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Singapore, SG

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Patents Grantslast 30 patents

Information Patent Grant
Defect detection recipe definition
- Patent number 8,289,508
- Issue date Oct 16, 2012
- GLOBALFOUNDRIES Singapore Pte. Ltd.
- Victor Seng Keong Lim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test chiplets for devices
- Patent number 8,178,368
- Issue date May 15, 2012
- GLOBALFOUNDRIES Singapore Pte. Ltd.
- Victor Seng Keong Lim
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
TEST CHIPLETS FOR DEVICES
- Publication number 20110114949
- Publication date May 19, 2011
- CHARTERED SEMICONDUCTOR MANUFACTURING, LTD.
- Victor Seng Keong LIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEFECT DETECTION RECIPE DEFINITION
- Publication number 20110116085
- Publication date May 19, 2011
- CHARTERED SEMICONDUCTOR MANUFACTURING, LTD.
- Victor Seng Keong LIM
- H01 - BASIC ELECTRIC ELEMENTS