Radhakrishna Kotti

Person

Boise, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Assemblies having conductive interconnects which are laterally and...
- Patent number 12,014,983
- Issue date Jun 18, 2024
- Micron Technology, Inc.
- Raju Ahmed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam probing techniques and related structures
- Patent number 11,996,336
- Issue date May 28, 2024
- Micron Technology, Inc.
- Amitava Majumdar
- G11 - INFORMATION STORAGE
Information Patent Grant
Methods for forming conductive vias, and associated devices and sys...
- Patent number 11,990,370
- Issue date May 21, 2024
- Micron Technology, Inc.
- Trupti D. Gawai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Socket design for a memory device
- Patent number 11,961,556
- Issue date Apr 16, 2024
- Micron Technology, Inc.
- Amitava Majumdar
- G11 - INFORMATION STORAGE
Information Patent Grant
Leakage source detection for memory with varying conductive path le...
- Patent number 11,636,911
- Issue date Apr 25, 2023
- Micron Technology, Inc.
- Amitava Majumdar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods for forming conductive vias, and associated devices and sys...
- Patent number 11,574,842
- Issue date Feb 7, 2023
- Micron Technology, Inc.
- Trupti D. Gawai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for forming conductive vias, and associated devices and sys...
- Patent number 11,515,204
- Issue date Nov 29, 2022
- Micron Technology, Inc.
- Trupti D. Gawai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Assemblies having conductive interconnects which are laterally and...
- Patent number 11,482,492
- Issue date Oct 25, 2022
- Micron Technology, Inc.
- Raju Ahmed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam probing techniques and related structures
- Patent number 11,302,589
- Issue date Apr 12, 2022
- Micron Technology, Inc.
- Amitava Majumdar
- G11 - INFORMATION STORAGE
Information Patent Grant
Socket design for a memory device
- Patent number 11,222,695
- Issue date Jan 11, 2022
- Micron Technology, Inc.
- Amitava Majumdar
- G11 - INFORMATION STORAGE
Information Patent Grant
Leakage source detection by scanning access lines
- Patent number 11,081,203
- Issue date Aug 3, 2021
- Micron Technology, Inc.
- Amitava Majumdar
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTRON BEAM PROBING TECHNIQUES AND RELATED STRUCTURES
- Publication number 20240355685
- Publication date Oct 24, 2024
- Micron Technology, Inc.
- Amitava Majumdar
- G11 - INFORMATION STORAGE
Information Patent Application
SOCKET DESIGN FOR A MEMORY DEVICE
- Publication number 20240347107
- Publication date Oct 17, 2024
- Micron Technology, Inc.
- Amitava Majumdar
- G11 - INFORMATION STORAGE
Information Patent Application
Assemblies having Conductive Interconnects which are Laterally and...
- Publication number 20240282702
- Publication date Aug 22, 2024
- Micron Technology, Inc.
- Raju Ahmed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR FORMING CONDUCTIVE VIAS, AND ASSOCIATED DEVICES AND SYS...
- Publication number 20240258167
- Publication date Aug 1, 2024
- Micron Technology, Inc.
- Trupti D. Gawai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST STRUCTURES FOR A WAFER, AND ASSOCIATED DEVICES, SYSTEMS, AND M...
- Publication number 20230298951
- Publication date Sep 21, 2023
- Micron Technology, Inc.
- Chase M. Hunter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURES AND METHODS FOR DICING SEMICONDUCTOR DEVICES
- Publication number 20230290684
- Publication date Sep 14, 2023
- Micron Technology, Inc.
- Wei Chang Wong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR FORMING CONDUCTIVE VIAS, AND ASSOCIATED DEVICES AND SYS...
- Publication number 20230163030
- Publication date May 25, 2023
- Micron Technology, Inc.
- Trupti D. Gawai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR FORMING CONDUCTIVE VIAS, AND ASSOCIATED DEVICES AND SYS...
- Publication number 20230113573
- Publication date Apr 13, 2023
- Micron Technology, Inc.
- Trupti D. Gawai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Assemblies having Conductive Interconnects which are Laterally and...
- Publication number 20230021072
- Publication date Jan 19, 2023
- Micron Technology, Inc.
- Raju Ahmed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR FORMING CONDUCTIVE VIAS, AND ASSOCIATED DEVICES AND SYS...
- Publication number 20220336277
- Publication date Oct 20, 2022
- Micron Technology, Inc.
- Trupti D. Gawai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM PROBING TECHNIQUES AND RELATED STRUCTURES
- Publication number 20220301946
- Publication date Sep 22, 2022
- Micron Technology, Inc.
- Amitava Majumdar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR FORMING CONDUCTIVE VIAS, AND ASSOCIATED DEVICES AND SYS...
- Publication number 20220208606
- Publication date Jun 30, 2022
- Micron Technology, Inc.
- Trupti D. Gawai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOCKET DESIGN FOR A MEMORY DEVICE
- Publication number 20220208264
- Publication date Jun 30, 2022
- Micron Technology, Inc.
- Amitava Majumdar
- G11 - INFORMATION STORAGE
Information Patent Application
LEAKAGE SOURCE DETECTION
- Publication number 20220020446
- Publication date Jan 20, 2022
- Micron Technology, Inc.
- Amitava Majumdar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Assemblies having Conductive Interconnects which are Laterally and...
- Publication number 20220013449
- Publication date Jan 13, 2022
- Micron Technology, Inc.
- Raju Ahmed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM PROBING TECHNIQUES AND RELATED STRUCTURES
- Publication number 20210166979
- Publication date Jun 3, 2021
- Micron Technology, Inc.
- Amitava Majumdar
- G11 - INFORMATION STORAGE
Information Patent Application
SOCKET DESIGN FOR A MEMORY DEVICE
- Publication number 20210151105
- Publication date May 20, 2021
- Micron Technology, Inc.
- Amitava Majumdar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LEAKAGE SOURCE DETECTION BY SCANNING ACCESS LINES
- Publication number 20210151119
- Publication date May 20, 2021
- Micron Technology, Inc.
- Amitava Majumdar
- H01 - BASIC ELECTRIC ELEMENTS

Radhakrishna Kotti

Person

Patents Grantslast 30 patents

Assemblies having conductive interconnects which are laterally and...

Electron beam probing techniques and related structures

Methods for forming conductive vias, and associated devices and sys...

Socket design for a memory device

Leakage source detection for memory with varying conductive path le...

Methods for forming conductive vias, and associated devices and sys...

Methods for forming conductive vias, and associated devices and sys...

Assemblies having conductive interconnects which are laterally and...

Electron beam probing techniques and related structures

Socket design for a memory device

Leakage source detection by scanning access lines

Patents Applicationslast 30 patents

ELECTRON BEAM PROBING TECHNIQUES AND RELATED STRUCTURES

SOCKET DESIGN FOR A MEMORY DEVICE

Assemblies having Conductive Interconnects which are Laterally and...

METHODS FOR FORMING CONDUCTIVE VIAS, AND ASSOCIATED DEVICES AND SYS...

TEST STRUCTURES FOR A WAFER, AND ASSOCIATED DEVICES, SYSTEMS, AND M...

STRUCTURES AND METHODS FOR DICING SEMICONDUCTOR DEVICES

METHODS FOR FORMING CONDUCTIVE VIAS, AND ASSOCIATED DEVICES AND SYS...

METHODS FOR FORMING CONDUCTIVE VIAS, AND ASSOCIATED DEVICES AND SYS...

Assemblies having Conductive Interconnects which are Laterally and...

METHODS FOR FORMING CONDUCTIVE VIAS, AND ASSOCIATED DEVICES AND SYS...

ELECTRON BEAM PROBING TECHNIQUES AND RELATED STRUCTURES

METHODS FOR FORMING CONDUCTIVE VIAS, AND ASSOCIATED DEVICES AND SYS...

SOCKET DESIGN FOR A MEMORY DEVICE

LEAKAGE SOURCE DETECTION

Assemblies having Conductive Interconnects which are Laterally and...

ELECTRON BEAM PROBING TECHNIQUES AND RELATED STRUCTURES

SOCKET DESIGN FOR A MEMORY DEVICE

LEAKAGE SOURCE DETECTION BY SCANNING ACCESS LINES