Radostin S. Danev

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Aichi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Lens system for phase plate for transmission electron microscope an...
- Patent number 6,744,048
- Issue date Jun 1, 2004
- Jeol Ltd.
- Fumio Hosokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Differential contrast transmission electron microscope and method o...
- Patent number 6,674,078
- Issue date Jan 6, 2004
- Jeol Ltd.
- Kuniaki Nagayama
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Phase Plate For Phase-Contrast Electron Microscope, Method For Manu...
- Publication number 20080202918
- Publication date Aug 28, 2008
- Kuniaki Nagayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Differential contrast transmission electron microscope and method o...
- Publication number 20030066964
- Publication date Apr 10, 2003
- JEOL Ltd.
- Kuniaki Nagayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Lens system for phase plate for transmission electron microscope an...
- Publication number 20020148962
- Publication date Oct 17, 2002
- JEOL Ltd.
- Fumio Hosokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Thin-film phase plate, phase-contrast electron microscope using sam...
- Publication number 20020011566
- Publication date Jan 31, 2002
- JEOL Ltd.
- Kuniaki Nagayama
- H01 - BASIC ELECTRIC ELEMENTS