Rae-Won YI

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Suwon-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Method of inspecting surface and method of inspecting photomask usi...
- Patent number 9,897,554
- Issue date Feb 20, 2018
- Samsung Electronics Co., Ltd.
- Ji-hoon Na
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Exposure apparatus and method of manufacturing semiconductor device
- Patent number 9,892,884
- Issue date Feb 13, 2018
- Samsung Electronics Co., Ltd.
- Rae-Won Yi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photolithography patterning system using feature parameters
- Patent number 9,529,960
- Issue date Dec 27, 2016
- Samsung Electronics Co., Ltd.
- Jin Choi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods of providing photolithography patterns using feature parame...
- Patent number 9,017,904
- Issue date Apr 28, 2015
- Samsung Electronics Co., Ltd.
- Jin Choi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electron beam depicting pattern design, photomask, methods of depic...
- Patent number 8,465,884
- Issue date Jun 18, 2013
- Samsung Electronics Co., Ltd.
- Jin Choi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
EXPOSURE APPARATUS AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20170053773
- Publication date Feb 23, 2017
- Samsung Electronics Co., Ltd.
- Rae-Won YI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF INSPECTING SURFACE AND METHOD OF INSPECTING PHOTOMASK USI...
- Publication number 20160356727
- Publication date Dec 8, 2016
- Samsung Electronics Co., Ltd.
- Ji-hoon Na
- G01 - MEASURING TESTING
Information Patent Application
METHODS OF PROVIDING PHOTOLITHOGRAPHY PATTERNS USING FEATURE PARAME...
- Publication number 20150220679
- Publication date Aug 6, 2015
- Samsung Electronics Co., Ltd.
- Jin Choi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods of Providing Photolithography Patterns Using Feature Parame...
- Publication number 20140045334
- Publication date Feb 13, 2014
- Jin Choi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRON BEAM DEPICTING PATTERN DESIGN, PHOTOMASK, METHODS OF DEPIC...
- Publication number 20110165778
- Publication date Jul 7, 2011
- Jin CHOI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY