Raf Nysen

Follow

Person

Veltem-Beisem, BE

People

Patents Grantslast 30 patents

Information Patent Grant
Measurement probe unit for metrology applications
- Patent number 10,267,629
- Issue date Apr 23, 2019
- Nikon Metrology NV
- Frank Thys
- G01 - MEASURING TESTING
Information Patent Grant
Optical scanning probe
- Patent number 9,696,146
- Issue date Jul 4, 2017
- Nikon Metrology NV
- Patrick Blanckaert
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL SCANNING PROBE
- Publication number 20150043008
- Publication date Feb 12, 2015
- NIKON METROLOGY N.V.
- Patrick Blanckaert
- G01 - MEASURING TESTING