Rafael Bistritzer

Person

Petach Tikva, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Geometry based three dimensional reconstruction of a semiconductor...
- Patent number 11,953,316
- Issue date Apr 9, 2024
- Applied Materials Israel Ltd.
- Rafael Bistritzer
- G01 - MEASURING TESTING
Information Patent Grant
Lateral recess measurement in a semiconductor specimen
- Patent number 11,921,063
- Issue date Mar 5, 2024
- Applied Materials Israel Ltd.
- Michael Chemama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reconstruction of a distorted image of an array of structural eleme...
- Patent number 11,798,138
- Issue date Oct 24, 2023
- Applied Materials Israel Ltd.
- Yehuda Cohen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Local shape deviation in a semiconductor specimen
- Patent number 11,686,571
- Issue date Jun 27, 2023
- Applied Materials Israel Ltd.
- Roman Kris
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Identification of an array in a semiconductor specimen
- Patent number 11,645,831
- Issue date May 9, 2023
- Applied Materials Israel Ltd.
- Yehuda Cohen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Generating a metrology recipe usable for examination of a semicondu...
- Patent number 11,443,420
- Issue date Sep 13, 2022
- Applied Materials Israel Ltd.
- Roman Kris
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Determining three dimensional information
- Patent number 11,321,835
- Issue date May 3, 2022
- Applied Materials Israel Ltd.
- Anna Levant
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
OPTIMIZATION OF A METROLOGY ALGORITHM FOR EXAMINATION OF SEMICONDUC...
- Publication number 20240428395
- Publication date Dec 26, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Rafael BISTRITZER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RECONSTRUCTION OF A DISTORTED IMAGE OF AN ARRAY OF STRUCTURAL ELEME...
- Publication number 20230419456
- Publication date Dec 28, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Yehuda Cohen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EXAMINATION OF A HOLE FORMED IN A SEMICONDUCTOR SPECIMEN
- Publication number 20230420308
- Publication date Dec 28, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Rafael BISTRITZER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STABILIZATION OF A MANUFACTURING PROCESS OF A SPECIMEN BY SHAPE ANA...
- Publication number 20230230223
- Publication date Jul 20, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Einat FRISHMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IDENTIFICATION OF AN ARRAY IN A SEMICONDUCTOR SPECIMEN
- Publication number 20230230349
- Publication date Jul 20, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Yehuda COHEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETECTION OF DEFECTS USING A COMPUTATIONALLY EFFICIENT SEGMENTATION...
- Publication number 20230206417
- Publication date Jun 29, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Elad COHEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LOCAL SHAPE DEVIATION IN A SEMICONDUCTOR SPECIMEN
- Publication number 20230069303
- Publication date Mar 2, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Roman KRIS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LATERAL RECESS MEASUREMENT IN A SEMICONDUCTOR SPECIMEN
- Publication number 20230023363
- Publication date Jan 26, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Michael CHEMAMA
- G01 - MEASURING TESTING
Information Patent Application
GENERATING A METROLOGY RECIPE USABLE FOR EXAMINATION OF A SEMICONDU...
- Publication number 20220207681
- Publication date Jun 30, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Roman KRIS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THREE-DIMENSIONAL RECONSTRUCTION OF A SEMICONDUCTOR SPECIMEN
- Publication number 20220082376
- Publication date Mar 17, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Rafael BISTRITZER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RECONSTRUCTION OF A DISTORTED IMAGE OF AN ARRAY OF STRUCTURAL ELEME...
- Publication number 20220012852
- Publication date Jan 13, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Yehuda COHEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IDENTIFICATION OF AN ARRAY IN A SEMICONDUCTOR SPECIMEN
- Publication number 20220012861
- Publication date Jan 13, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Yehuda COHEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINING THREE DIMENSIONAL INFORMATION
- Publication number 20210295499
- Publication date Sep 23, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Anna Levant
- G06 - COMPUTING CALCULATING COUNTING

Rafael Bistritzer

Person

Patents Grantslast 30 patents

Geometry based three dimensional reconstruction of a semiconductor...

Lateral recess measurement in a semiconductor specimen

Reconstruction of a distorted image of an array of structural eleme...

Local shape deviation in a semiconductor specimen

Identification of an array in a semiconductor specimen

Generating a metrology recipe usable for examination of a semicondu...

Determining three dimensional information

Patents Applicationslast 30 patents

OPTIMIZATION OF A METROLOGY ALGORITHM FOR EXAMINATION OF SEMICONDUC...

RECONSTRUCTION OF A DISTORTED IMAGE OF AN ARRAY OF STRUCTURAL ELEME...

EXAMINATION OF A HOLE FORMED IN A SEMICONDUCTOR SPECIMEN

STABILIZATION OF A MANUFACTURING PROCESS OF A SPECIMEN BY SHAPE ANA...

IDENTIFICATION OF AN ARRAY IN A SEMICONDUCTOR SPECIMEN

DETECTION OF DEFECTS USING A COMPUTATIONALLY EFFICIENT SEGMENTATION...

LOCAL SHAPE DEVIATION IN A SEMICONDUCTOR SPECIMEN

LATERAL RECESS MEASUREMENT IN A SEMICONDUCTOR SPECIMEN

GENERATING A METROLOGY RECIPE USABLE FOR EXAMINATION OF A SEMICONDU...

THREE-DIMENSIONAL RECONSTRUCTION OF A SEMICONDUCTOR SPECIMEN

RECONSTRUCTION OF A DISTORTED IMAGE OF AN ARRAY OF STRUCTURAL ELEME...

IDENTIFICATION OF AN ARRAY IN A SEMICONDUCTOR SPECIMEN

DETERMINING THREE DIMENSIONAL INFORMATION