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Rafael Storz
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Heidelberg, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Method for superimposing optical information in a scanning microscope
Patent number
7,873,241
Issue date
Jan 18, 2011
Leica Microsystems CMS GmbH
Rafael Storz
G02 - OPTICS
Information
Patent Grant
Device for generating a laser light beam
Patent number
7,835,601
Issue date
Nov 16, 2010
Leica Microsystems CMS GmbH
Volker Seyfried
G01 - MEASURING TESTING
Information
Patent Grant
Broadband laser illumination device for a scanning microscope with...
Patent number
7,679,822
Issue date
Mar 16, 2010
Leica Microsystems CMS GmbH
Holger Birk
G01 - MEASURING TESTING
Information
Patent Grant
Method for separating detection channels of a microscope system
Patent number
7,596,454
Issue date
Sep 29, 2009
Leica Microsystems CMS GmbH
Rafael Storz
G01 - MEASURING TESTING
Information
Patent Grant
Scanning microscope comprising a confocal slit scanner for imaging...
Patent number
7,477,380
Issue date
Jan 13, 2009
Leica Microsystems CMS GmbH
Werner Knebel
G02 - OPTICS
Information
Patent Grant
Scanning microscope
Patent number
7,477,449
Issue date
Jan 13, 2009
Leica Microsystems CMS GmbH
Werner Knebel
G02 - OPTICS
Information
Patent Grant
Microscope
Patent number
7,463,414
Issue date
Dec 9, 2008
Leica Microsystems CMS GmbH
Rafael Storz
G02 - OPTICS
Information
Patent Grant
Device for generating a light beam including multiple wavelengths
Patent number
7,280,570
Issue date
Oct 9, 2007
Volker Seyfried
G02 - OPTICS
Information
Patent Grant
Apparatus for the detection of photons of a light beam having a thr...
Patent number
7,259,366
Issue date
Aug 21, 2007
Leica Microsystems CMS GmbH
Holger Birk
G02 - OPTICS
Information
Patent Grant
Method for setting the system parameters of a scanning microscope
Patent number
7,227,112
Issue date
Jun 5, 2007
Leica Microsystems CMS GmbH
Rafael Storz
G01 - MEASURING TESTING
Information
Patent Grant
Device for selectively detecting specific wavelength components of...
Patent number
7,223,961
Issue date
May 29, 2007
Leica Microsystems CMS GmbH
Holger Birk
G01 - MEASURING TESTING
Information
Patent Grant
Scanning microscope
Patent number
7,151,633
Issue date
Dec 19, 2006
Leica Microsystems CMS GmbH
Rafael Storz
G02 - OPTICS
Information
Patent Grant
Method for classifying object image regions of an object to be dete...
Patent number
7,151,270
Issue date
Dec 19, 2006
Leica Microsystems CMS GmbH
Holger Birk
G01 - MEASURING TESTING
Information
Patent Grant
Method for scanning microscopy, scanning microscope, and apparatus...
Patent number
7,133,130
Issue date
Nov 7, 2006
Leica Microsystems CMS GmbH
Rafael Storz
G01 - MEASURING TESTING
Information
Patent Grant
Arrangement for examining microscopic preparations with a scanning...
Patent number
7,123,408
Issue date
Oct 17, 2006
Leica Microsystems CMS GmbH
Holger Birk
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and instrument for microscopy
Patent number
7,110,645
Issue date
Sep 19, 2006
Leica Microsystems CMS GmbH
Holger Birk
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Scanning microscope having an acoustooptical component
Patent number
7,087,891
Issue date
Aug 8, 2006
Leica Mircosystems Heidelberg GmbH
Werner Knebel
G02 - OPTICS
Information
Patent Grant
Method and apparatus for investigating layers of tissues in living...
Patent number
7,041,951
Issue date
May 9, 2006
Leica Microsystems CMS GmbH
Martin Hoppe
G02 - OPTICS
Information
Patent Grant
Method and device for separating different emission wavelengths in...
Patent number
7,038,193
Issue date
May 2, 2006
Leica Microsystems Heidelberg GmbH
Volker Seyfried
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for beam deflection
Patent number
7,002,717
Issue date
Feb 21, 2006
Leica Microsystems CMS GmbH
Rafael Storz
G02 - OPTICS
Information
Patent Grant
Microscope objective, microscope, and method for imaging a specimen
Patent number
6,909,540
Issue date
Jun 21, 2005
Leica Microsystems Heidelberg GmbH
Johann Engelhardt
G02 - OPTICS
Information
Patent Grant
Method and instrument for microscopy
Patent number
6,898,367
Issue date
May 24, 2005
Leica Microsystems Heidelberg GmbH
Holger Birk
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Arrangement for examining microscopic preparations with a scanning...
Patent number
6,888,674
Issue date
May 3, 2005
Leica Microsystems Heidelberg GmbH
Holger Birk
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for illuminating an object with light from a laser light source
Patent number
6,864,989
Issue date
Mar 8, 2005
Leica Microsystems Heidelberg GmbH
Rafael Storz
G02 - OPTICS
Information
Patent Grant
Laser illuminator and method
Patent number
6,796,699
Issue date
Sep 28, 2004
Leica Microsystems Heidelberg GmbH
Holger Birk
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus for combining light and confocal scanning microscope
Patent number
6,737,635
Issue date
May 18, 2004
Leica Microsystems Heidelberg GmbH
Johann Engelhardt
G02 - OPTICS
Information
Patent Grant
Scanning microscope
Patent number
6,710,918
Issue date
Mar 23, 2004
Leica Microsystems Heidelberg GmbH
Holger Birk
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Scanning microscope with multiband illumination and optical compone...
Patent number
6,654,166
Issue date
Nov 25, 2003
Leica Microsystems Heidelberg GmbH
Holger Birk
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Illuminating device and microscope
Patent number
6,611,643
Issue date
Aug 26, 2003
Leica Microsystems Heidelberg GmbH
Holger Birk
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Vibration damping device for microscopes and microscope with a vibr...
Patent number
6,567,212
Issue date
May 20, 2003
Leica Microsystems Heidelberg GmbH
Johann Engelhardt
G02 - OPTICS
Patents Applications
last 30 patents
Information
Patent Application
ARRANGEMENT FOR EXAMINING MICROSCOPIC PREPARATIONS WITH A SCANNING...
Publication number
20090086315
Publication date
Apr 2, 2009
LEICA MICROSYSTEM CMS GMBH
Holger BIRK
G02 - OPTICS
Information
Patent Application
DEVICE FOR GENERATING A LASER LIGHT BEAM
Publication number
20080095200
Publication date
Apr 24, 2008
Leica Microsystems CMS GmbH
Volker Seyfried
G02 - OPTICS
Information
Patent Application
Scanning microscope
Publication number
20070252499
Publication date
Nov 1, 2007
Leica Microsystems CMS GmbH
Holger Birk
G02 - OPTICS
Information
Patent Application
Arrangement for examining microscopic preparations with a scanning...
Publication number
20070035822
Publication date
Feb 15, 2007
Leica Microsystems CMS GmbH
Holger Birk
G02 - OPTICS
Information
Patent Application
Microscope
Publication number
20060219881
Publication date
Oct 5, 2006
Leica Microsystems CMS GmbH
Rafael Storz
G02 - OPTICS
Information
Patent Application
Apparatus for the detection of photons of a light beam
Publication number
20060215264
Publication date
Sep 28, 2006
Holger Birk
G02 - OPTICS
Information
Patent Application
Microscope
Publication number
20060164723
Publication date
Jul 27, 2006
Leica Microsystems CMS GmbH
Rafael Storz
G02 - OPTICS
Information
Patent Application
Scanning microscope comprising a confocal slit scanner for reproduc...
Publication number
20060152787
Publication date
Jul 13, 2006
Leica Microsystems CMS GmbH
Werner Knebel
G02 - OPTICS
Information
Patent Application
Method for superimposing optical information in a scanning microscope
Publication number
20060066734
Publication date
Mar 30, 2006
Leica Microsystems CMS GmbH
Rafael Storz
G02 - OPTICS
Information
Patent Application
Device for generating a light beam including multiple wavelengths
Publication number
20050249457
Publication date
Nov 10, 2005
Leica Microsystems Heidelberg GmbH
Volker Seyfried
G02 - OPTICS
Information
Patent Application
Device for generating a laser light beam
Publication number
20050201441
Publication date
Sep 15, 2005
Leica Microsystems Heidelberg GmbH
Volker Seyfried
G02 - OPTICS
Information
Patent Application
Method and device for separating different emission wavelengths in...
Publication number
20050121603
Publication date
Jun 9, 2005
Leica Microsystems Heidelberg GmbH
Volker Seyfried
G02 - OPTICS
Information
Patent Application
Arrangement for examining microscopic preparations with a scanning...
Publication number
20050122580
Publication date
Jun 9, 2005
Leica Microsystems Heidelberg GmbH
Holger Birk
G02 - OPTICS
Information
Patent Application
Method and instrument for microscopy
Publication number
20050111816
Publication date
May 26, 2005
Leica Microsystems Heidelberg GmbH
Holger Birk
G02 - OPTICS
Information
Patent Application
Device for selectively detecting specific wavelength components of...
Publication number
20050045812
Publication date
Mar 3, 2005
Leica Microsystems Heidelberg GmbH
Holger Birk
G01 - MEASURING TESTING
Information
Patent Application
Scanning microscope
Publication number
20050024721
Publication date
Feb 3, 2005
Leica Microsystems Heidelberg GmbH
Rafael Storz
G02 - OPTICS
Information
Patent Application
Method for classifying object image regions of an object to be dete...
Publication number
20040251426
Publication date
Dec 16, 2004
Leica Microsystems Heidelberg GmbH
Holger Birk
G01 - MEASURING TESTING
Information
Patent Application
Method for separating detection channels of a microscope system
Publication number
20040209300
Publication date
Oct 21, 2004
Leica Microsystems Heidelberg GmbH
Rafael Storz
G02 - OPTICS
Information
Patent Application
Scanning microscope having an acoustooptical component
Publication number
20040169134
Publication date
Sep 2, 2004
Leica Microsystems Heidelberg GmbH
Werner Knebel
G02 - OPTICS
Information
Patent Application
Scanning microscope
Publication number
20040095624
Publication date
May 20, 2004
Leica Microsystems Heidelberg GmbH
Werner Knebel
G02 - OPTICS
Information
Patent Application
Method and apparatus for investigating layers of tissues in living...
Publication number
20040092828
Publication date
May 13, 2004
Leica Microsystems Heidelberg GmbH
Martin Hoppe
G02 - OPTICS
Information
Patent Application
Method for scanning microscopy, and scanning microscope
Publication number
20040032651
Publication date
Feb 19, 2004
Leica Microsystems Heidelberg GmbH
Rafael Storz
G02 - OPTICS
Information
Patent Application
Method for setting the system parameters of a scanning microscope
Publication number
20040000639
Publication date
Jan 1, 2004
Leica Microsystems Heidelberg GmbH
Rafael Storz
G02 - OPTICS
Information
Patent Application
Method for scanning microscopy, scanning microscope, and apparatus...
Publication number
20030226977
Publication date
Dec 11, 2003
Leica Microsystems Heidelberg GmbH
Rafael Storz
G02 - OPTICS
Information
Patent Application
Microscope objective, microscope, and method for imaging a specimen
Publication number
20030103263
Publication date
Jun 5, 2003
Leica Microsystems Heidelberg GmbH
Johann Engelhardt
G02 - OPTICS
Information
Patent Application
Scanning microscope with multiband illumination and optical compone...
Publication number
20020050564
Publication date
May 2, 2002
Holger Birk
B82 - NANO-TECHNOLOGY
Information
Patent Application
Method for illuminating an object with light from a laser light source
Publication number
20020043618
Publication date
Apr 18, 2002
Rafael Storz
G02 - OPTICS
Information
Patent Application
Arrangement for studying microscopic preparations with a scanning m...
Publication number
20020043622
Publication date
Apr 18, 2002
Holger Birk
B82 - NANO-TECHNOLOGY
Information
Patent Application
Method and instrument for microscopy
Publication number
20020028044
Publication date
Mar 7, 2002
Holger Birk
B82 - NANO-TECHNOLOGY
Information
Patent Application
Entangled-photon microscope and confocal microscope
Publication number
20020018290
Publication date
Feb 14, 2002
Holger Birk
B82 - NANO-TECHNOLOGY