Raffaele Ubaldo Vallauri

Person

Cernusco Lombardone, IT

People

Patents Grantslast 30 patents

Information Patent Grant
Contact probe for high-frequency applications with improved current...
- Patent number 12,044,703
- Issue date Jul 23, 2024
- Technoprobe S.p.A.
- Raffaele Vallauri
- G01 - MEASURING TESTING
Information Patent Grant
Manufacturing method of a multi-layer for a probe card
- Patent number 12,019,111
- Issue date Jun 25, 2024
- Technoprobe S.p.A.
- Roberto Crippa
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Contact probe and relative probe head of an apparatus for testing e...
- Patent number 11,442,080
- Issue date Sep 13, 2022
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Vertical probe testing head with improved frequency properties
- Patent number 11,029,337
- Issue date Jun 8, 2021
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe and relative probe head of an apparatus for testing e...
- Patent number 11,016,122
- Issue date May 25, 2021
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Testing head comprising vertical probes
- Patent number 10,551,433
- Issue date Feb 4, 2020
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Probe card for a testing apparatus of electronic devices, particula...
- Patent number 10,509,056
- Issue date Dec 17, 2019
- Technoprobe S.p.A.
- Riccardo Liberini
- G01 - MEASURING TESTING
Information Patent Grant
Manufacturing method of contact probes for a testing head
- Patent number 10,401,387
- Issue date Sep 3, 2019
- Technoprobe S.p.A.
- Raffaele Ubaldo Vallauri
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Contact probe and corresponding testing head
- Patent number 10,386,388
- Issue date Aug 20, 2019
- TECHNOPROBE S.P.A.
- Daniele Acconcia
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe for a testing head
- Patent number 10,228,392
- Issue date Mar 12, 2019
- Technoprobe S.p.A.
- Roberto Crippa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Testing head of electronic devices
- Patent number 9,829,508
- Issue date Nov 28, 2017
- Technoprobe S.p.A.
- Stefano Felici
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE HEAD WITH AN IMPROVED CONTACT BETWEEN CONTACT PROBES AND META...
- Publication number 20240012027
- Publication date Jan 11, 2024
- TECHNOPROBE S.P.A.
- Raffaele VALLAURI
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE FOR HIGH-FREQUENCY APPLICATIONS WITH IMPROVED CURRENT...
- Publication number 20230028352
- Publication date Jan 26, 2023
- TECHNOPROBE S.P.A.
- Raffaele VALLAURI
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE AND RELATIVE PROBE HEAD OF AN APPARATUS FOR TESTING E...
- Publication number 20210247422
- Publication date Aug 12, 2021
- Technoprobe S.p.A.
- Roberto CRIPPA
- G01 - MEASURING TESTING
Information Patent Application
MANUFACTURING METHOD OF A MULTI-LAYER FOR A PROBE CARD
- Publication number 20200072873
- Publication date Mar 5, 2020
- Technoprobe S.p.A.
- Roberto CRIPPA
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL PROBE TESTING HEAD WITH IMPROVED FREQUENCY PROPERTIES
- Publication number 20190377006
- Publication date Dec 12, 2019
- Technoprobe S.p.A.
- Roberto CRIPPA
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE AND RELATIVE PROBE HEAD OF AN APPARATUS FOR TESTING E...
- Publication number 20190293686
- Publication date Sep 26, 2019
- Technoprobe S.p.A.
- Roberto CRIPPA
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE AND CORRESPONDING TESTING HEAD
- Publication number 20180024166
- Publication date Jan 25, 2018
- Technoprobe S.p.A.
- Daniele Acconcia
- G01 - MEASURING TESTING
Information Patent Application
TESTING HEAD COMPRISING VERTICAL PROBES
- Publication number 20180003767
- Publication date Jan 4, 2018
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Application
MANUFACTURING METHOD OF CONTACT PROBES FOR A TESTING HEAD
- Publication number 20170307656
- Publication date Oct 26, 2017
- Technoprobe S.p.A.
- Raffaele Ubaldo Vallauri
- B44 - DECORATIVE ARTS
Information Patent Application
CONTACT PROBE FOR A TESTING HEAD
- Publication number 20170269125
- Publication date Sep 21, 2017
- Technoprobe S.p.A.
- Roberto CRIPPA
- G01 - MEASURING TESTING
Information Patent Application
TESTING HEAD COMPRISING VERTICAL PROBES
- Publication number 20170122983
- Publication date May 4, 2017
- Technoprobe S.p.A.
- Daniele Acconcia
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE FOR A TESTING HEAD AND CORRESPONDING MANUFACTURING ME...
- Publication number 20170122980
- Publication date May 4, 2017
- Technoprobe S.p.A.
- Roberto Crippa
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
CONTACT PROBE FOR A TESTING HEAD
- Publication number 20170059612
- Publication date Mar 2, 2017
- Technoprobe S.p.A.
- Roberto CRIPPA
- G01 - MEASURING TESTING
Information Patent Application
TESTING HEAD OF ELECTRONIC DEVICES
- Publication number 20150309076
- Publication date Oct 29, 2015
- Technoprobe S.p.A.
- Stefano Felici
- G01 - MEASURING TESTING

Raffaele Ubaldo Vallauri

Person

Patents Grantslast 30 patents

Contact probe for high-frequency applications with improved current...

Manufacturing method of a multi-layer for a probe card

Contact probe and relative probe head of an apparatus for testing e...

Vertical probe testing head with improved frequency properties

Contact probe and relative probe head of an apparatus for testing e...

Testing head comprising vertical probes

Probe card for a testing apparatus of electronic devices, particula...

Manufacturing method of contact probes for a testing head

Contact probe and corresponding testing head

Contact probe for a testing head

Testing head of electronic devices

Patents Applicationslast 30 patents

PROBE HEAD WITH AN IMPROVED CONTACT BETWEEN CONTACT PROBES AND META...

CONTACT PROBE FOR HIGH-FREQUENCY APPLICATIONS WITH IMPROVED CURRENT...

CONTACT PROBE AND RELATIVE PROBE HEAD OF AN APPARATUS FOR TESTING E...

MANUFACTURING METHOD OF A MULTI-LAYER FOR A PROBE CARD

VERTICAL PROBE TESTING HEAD WITH IMPROVED FREQUENCY PROPERTIES

CONTACT PROBE AND RELATIVE PROBE HEAD OF AN APPARATUS FOR TESTING E...

CONTACT PROBE AND CORRESPONDING TESTING HEAD

TESTING HEAD COMPRISING VERTICAL PROBES

MANUFACTURING METHOD OF CONTACT PROBES FOR A TESTING HEAD

CONTACT PROBE FOR A TESTING HEAD

TESTING HEAD COMPRISING VERTICAL PROBES

CONTACT PROBE FOR A TESTING HEAD AND CORRESPONDING MANUFACTURING ME...

CONTACT PROBE FOR A TESTING HEAD

TESTING HEAD OF ELECTRONIC DEVICES