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Raffi Garaedian
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Monrovia, CA, US
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last 30 patents
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Patent Grant
Planarizing probe card
Patent number
7,791,361
Issue date
Sep 7, 2010
Touchdown Technologies, Inc.
Ken Karklin
G01 - MEASURING TESTING
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Patent Grant
Semiconductor testing device with elastomer interposer
Patent number
7,759,951
Issue date
Jul 20, 2010
Touchdown Technologies, Inc.
Ken Karklin
G01 - MEASURING TESTING