Rafi DE PICCIOTTO

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Carmei Yosef, IL

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Patents Grantslast 30 patents

Information Patent Grant
Scanning electron microscope
- Patent number 9,466,458
- Issue date Oct 11, 2016
- B-NANO LTD.
- Dov Shachal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope, an interface and a method for observi...
- Patent number 9,431,213
- Issue date Aug 30, 2016
- B-Nano Ltd.
- Dov Shachal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope, an interface and a method for observi...
- Patent number 8,981,294
- Issue date Mar 17, 2015
- B-Nano Ltd.
- Dov Shachal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vacuumed device and a scanning electron microscope
- Patent number 8,492,716
- Issue date Jul 23, 2013
- B-Nano Ltd.
- Dov Shachal
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Scanning electron microscope, an interface and a method for observi...
- Patent number 8,334,510
- Issue date Dec 18, 2012
- B-Nano Ltd.
- Dov Shachal
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20150380207
- Publication date Dec 31, 2015
- B-NANO LTD.
- Dov SHACHAL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE, AN INTERFACE AND A METHOD FOR OBSERVI...
- Publication number 20150243475
- Publication date Aug 27, 2015
- B-NANO LTD.
- Dov SHACHAL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE, AN INTERFACE AND A METHOD FOR OBSERVI...
- Publication number 20140117232
- Publication date May 1, 2014
- B-NANO LTD.
- Dov SHACHAL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VACUUMED DEVICE AND A SCANNING ELECTRON MICROSCOPE
- Publication number 20110210247
- Publication date Sep 1, 2011
- B-NANO LTD.
- Dov Shachal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE, AN INTERFACE AND A METHOD FOR OBSERVI...
- Publication number 20110168889
- Publication date Jul 14, 2011
- Dov Shachal
- G01 - MEASURING TESTING