Rafic Zein Makki

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Charlotte, NC, US

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Patents Grantslast 30 patents

Information Patent Grant
Methods and apparatus for testing electronic circuits
- Patent number 7,710,140
- Issue date May 4, 2010
- University of North Carolina at Charlotte
- David M. Binkley
- G11 - INFORMATION STORAGE
Information Patent Grant
Methods and apparatus for testing electronic circuits
- Patent number 7,148,717
- Issue date Dec 12, 2006
- University of North Carolina at Charlotte
- David M. Binkley
- G11 - INFORMATION STORAGE
Information Patent Grant
Methods and apparatus for testing electronic circuits
- Patent number 6,833,724
- Issue date Dec 21, 2004
- University of North Carolina at Charlotte
- David M. Binkley
- G11 - INFORMATION STORAGE
Information Patent Grant
Electro-optical method and apparatus for testing integrated circuits
- Patent number 5,216,359
- Issue date Jun 1, 1993
- University of North Carolina
- Rafic Z. Makki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Methods And Apparatus For Testing Electronic Circuits
- Publication number 20100097073
- Publication date Apr 22, 2010
- University of North Carolina at Charlotte
- David M. Binkley
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for testing electronic circuits
- Publication number 20070052438
- Publication date Mar 8, 2007
- David M. Binkley
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for testing electronic circuits
- Publication number 20040263198
- Publication date Dec 30, 2004
- David M. Binkley
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for testing electronic circuits
- Publication number 20030085729
- Publication date May 8, 2003
- David M. Binkley
- G01 - MEASURING TESTING