Rafik Marutyan

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Pleasanton, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Identifying layout pattern candidates
- Patent number 9,292,650
- Issue date Mar 22, 2016
- Synopsys Inc.
- Brian S. Gordon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for detection of failures in a wafer using tra...
- Patent number 7,602,964
- Issue date Oct 13, 2009
- Synopsys, Inc.
- Rafik Marutyan
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
IDENTIFYING LAYOUT PATTERN CANDIDATES
- Publication number 20150227670
- Publication date Aug 13, 2015
- Synopsys Inc.
- Brian S. Gordon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for detection of failures in a wafer using tra...
- Publication number 20070160281
- Publication date Jul 12, 2007
- HPL Technologies, Inc.
- Rafik Marutyan
- G06 - COMPUTING CALCULATING COUNTING