Raghavan Konuru

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Andhra Pradesh, IN

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Patents Grantslast 30 patents

Information Patent Grant
Deep learning image denoising for semiconductor-based applications
- Patent number 12,299,848
- Issue date May 13, 2025
- KLA Corporation
- Aditya Gulati
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mode selection for inspection
- Patent number 10,670,536
- Issue date Jun 2, 2020
- KLA-Tencor Corp.
- Martin Plihal
- G01 - MEASURING TESTING
Information Patent Grant
Automatic deskew using design files or inspection images
- Patent number 10,204,416
- Issue date Feb 12, 2019
- KLA-Tencor Corporation
- Arpit Jain
- G01 - MEASURING TESTING
Information Patent Grant
Sub-pixel alignment of inspection to design
- Patent number 9,996,942
- Issue date Jun 12, 2018
- KLA-Tencor Corp.
- Santosh Bhattacharyya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Creating defect classifiers and nuisance filters
- Patent number 9,613,411
- Issue date Apr 4, 2017
- KLA-Tencor Corp.
- Raghavan Konuru
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
RECOMMENDER SYSTEMS AND METHODS FOR AUTONOMOUS MODE SELECTION IN IN...
- Publication number 20250071419
- Publication date Feb 27, 2025
- KLA Corporation
- Raghavan Konuru
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
DEEP LEARNING IMAGE DENOISING FOR SEMICONDUCTOR-BASED APPLICATIONS
- Publication number 20220383456
- Publication date Dec 1, 2022
- KLA Corporation
- Aditya Gulati
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Mode Selection for Inspection
- Publication number 20190302031
- Publication date Oct 3, 2019
- KLA-Tencor Corporation
- Martin Plihal
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC DESKEW USING DESIGN FILES OR INSPECTION IMAGES
- Publication number 20170228866
- Publication date Aug 10, 2017
- KLA-Tencor Corporation
- Arpit Jain
- G01 - MEASURING TESTING
Information Patent Application
Sub-Pixel Alignment of Inspection to Design
- Publication number 20160275672
- Publication date Sep 22, 2016
- KLA-Tencor Corporation
- Santosh Bhattacharyya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Creating Defect Classifiers and Nuisance Filters
- Publication number 20150262038
- Publication date Sep 17, 2015
- KLA-Tencor Corporation
- Raghavan Konuru
- G06 - COMPUTING CALCULATING COUNTING