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Raghuveer Murukumpet
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Bangalore, IN
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Patents Grants
last 30 patents
Information
Patent Grant
On chip NMOS gapless LDO for high speed microcontrollers
Patent number
10,775,820
Issue date
Sep 15, 2020
Microchip Technology Incorporated
Raghuveer Murukumpet
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Capacitor-less low drop-out (LDO) regulator, integrated circuit, an...
Patent number
10,761,552
Issue date
Sep 1, 2020
Microchip Technology Incorporated
Raghuveer Murukumpet
G05 - CONTROLLING REGULATING
Information
Patent Grant
Capacitor-less low drop-out (LDO) regulator
Patent number
9,983,607
Issue date
May 29, 2018
Microchip Technology Incorporated
Raghuveer Murukumpet
G05 - CONTROLLING REGULATING
Information
Patent Grant
Temperature sensor peripheral having independent temperature coeffi...
Patent number
9,739,669
Issue date
Aug 22, 2017
Microchip Technology Incorporated
David Michael Susak
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
On Chip NMOS Capless LDO for High Speed Microcontrollers
Publication number
20190113942
Publication date
Apr 18, 2019
MICROCHIP TECHNOLOGY INCORPORATED
Raghuveer Murukumpet
G05 - CONTROLLING REGULATING
Information
Patent Application
Capacitor-Less Low Drop-Out (LDO) Regulator
Publication number
20180275706
Publication date
Sep 27, 2018
MICROCHIP TECHNOLOGY INCORPORATED
Raghuveer Murukumpet
G05 - CONTROLLING REGULATING
Information
Patent Application
Temperature Sensor Peripheral Having Independent Temperature Coeffi...
Publication number
20170350770
Publication date
Dec 7, 2017
MICROCHIP TECHNOLOGY INCORPORATED
David Michael Susak
G01 - MEASURING TESTING
Information
Patent Application
CAPACITOR-LESS LOW DROP-OUT (LDO) REGULATOR
Publication number
20160124448
Publication date
May 5, 2016
MICROCHIP TECHNOLOGY INCORPORATED
Raghuveer Murukumpet
G05 - CONTROLLING REGULATING
Information
Patent Application
Temperature Sensor Peripheral Having Independent Temperature Coeffi...
Publication number
20140161149
Publication date
Jun 12, 2014
David Michael Susak
G01 - MEASURING TESTING