TREA

Rahul Lakhawat

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  • Chennai, IN
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Patents Grantslast 30 patents

  • Information Patent Grant

    Wafer defect discovery
    • Patent number 9,518,934
    • Issue date Dec 13, 2016
    • KLA-Tencor Corp.
    • Hong Chen
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

  • Information Patent Application

    Wafer Defect Discovery
    • Publication number 20170076911
    • Publication date Mar 16, 2017
    • KLA-Tencor Corporation
    • Hong Chen
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Sub-Pixel Alignment of Inspection to Design
    • Publication number 20160275672
    • Publication date Sep 22, 2016
    • KLA-Tencor Corporation
    • Santosh Bhattacharyya
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    Wafer Defect Discovery
    • Publication number 20160123898
    • Publication date May 5, 2016
    • KLA-Tencor Corporation
    • Hong Chen
    • G01 - MEASURING TESTING