Rahul Vijay Kulkarni

Person

Pune, IN

People

Patents Grantslast 30 patents

Information Patent Grant
Analog to digital (A/D) converter with internal diagnostic circuit
- Patent number 11,206,035
- Issue date Dec 21, 2021
- Texas Instruments Incorporated
- Rahul Vijay Kulkarni
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Integrated self-test mechanism for an analog-to-digital converter,...
- Patent number 11,206,036
- Issue date Dec 21, 2021
- Texas Instruments Incorporated
- Rahul Vijay Kulkarni
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Sample and hold circuit with indefinite holding time
- Patent number 11,139,823
- Issue date Oct 5, 2021
- Texas Instruments Incorporated
- Rahul Vijay Kulkarni
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Systems and methods for testing analog to digital (A/D) converter w...
- Patent number 11,101,811
- Issue date Aug 24, 2021
- Texas Instruments Incorporated
- Kaustubh Gadgil
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Low noise and low distortion test method and system for analog-to-d...
- Patent number 10,892,768
- Issue date Jan 12, 2021
- Texas Instruments Incorporated
- Rahul Vijay Kulkarni
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Sample and hold circuit with indefinite holding time
- Patent number 10,673,455
- Issue date Jun 2, 2020
- Texas Instruments Incorporated
- Rahul Vijay Kulkarni
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Analog-to-digital converter
- Patent number 10,236,902
- Issue date Mar 19, 2019
- Texas Instruments Incorporated
- Shridhar More
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
Systems and Methods for Testing Analog to Digital (A/D) Converter w...
- Publication number 20210175891
- Publication date Jun 10, 2021
- TEXAS INSTRUMENTS INCORPORATED
- Kaustubh Gadgil
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Analog to Digital (A/D) Converter with Internal Diagnostic Circuit
- Publication number 20200295773
- Publication date Sep 17, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Rahul Vijay Kulkarni
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SAMPLE AND HOLD CIRCUIT WITH INDEFINITE HOLDING TIME
- Publication number 20200252077
- Publication date Aug 6, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Rahul Vijay Kulkarni
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
INTEGRATED SELF-TEST MECHANISM FOR AN ANALOG-TO-DIGITAL CONVERTER,...
- Publication number 20200186160
- Publication date Jun 11, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Rahul Vijay KULKARNI
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE AND HOLD CIRCUIT WITH INDEFINITE HOLDING TIME
- Publication number 20190348993
- Publication date Nov 14, 2019
- TEXAS INSTRUMENTS INCORPORATED
- Rahul Vijay Kulkarni
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ANALOG-TO-DIGITAL CONVERTER
- Publication number 20190222222
- Publication date Jul 18, 2019
- TEXAS INSTRUMENTS INCORPORATED
- Shridhar MORE
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
LOW NOISE AND LOW DISTORTION TEST METHOD AND SYSTEM FOR ANALOG-TO-D...
- Publication number 20190081634
- Publication date Mar 14, 2019
- TEXAS INSTRUMENTS INCORPORATED
- Rahul Vijay Kulkarni
- H03 - BASIC ELECTRONIC CIRCUITRY

Rahul Vijay Kulkarni

Person

Patents Grantslast 30 patents

Analog to digital (A/D) converter with internal diagnostic circuit

Integrated self-test mechanism for an analog-to-digital converter,...

Sample and hold circuit with indefinite holding time

Systems and methods for testing analog to digital (A/D) converter w...

Low noise and low distortion test method and system for analog-to-d...

Sample and hold circuit with indefinite holding time

Analog-to-digital converter

Patents Applicationslast 30 patents

Systems and Methods for Testing Analog to Digital (A/D) Converter w...

Analog to Digital (A/D) Converter with Internal Diagnostic Circuit

SAMPLE AND HOLD CIRCUIT WITH INDEFINITE HOLDING TIME

INTEGRATED SELF-TEST MECHANISM FOR AN ANALOG-TO-DIGITAL CONVERTER,...

SAMPLE AND HOLD CIRCUIT WITH INDEFINITE HOLDING TIME

ANALOG-TO-DIGITAL CONVERTER

LOW NOISE AND LOW DISTORTION TEST METHOD AND SYSTEM FOR ANALOG-TO-D...