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Raiko Meinhardt-Wildegger
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Erlangen, DE
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last 30 patents
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Patent Grant
Method for examination of a sample by means of the lock-in thermogr...
Patent number
10,761,039
Issue date
Sep 1, 2020
DCG Systems GmbH
Hans Heissenstein
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
LOCK-IN THERMOGRAPHY METHOD AND SYSTEM FOR HOT SPOT LOCALIZATION
Publication number
20160202126
Publication date
Jul 14, 2016
DCG SYSTEMS, INC.
Christian Schmidt
G01 - MEASURING TESTING
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Patent Application
METHOD FOR EXAMINATION OF A SAMPLE BY MEANS OF THE LOCK-IN THERMOGR...
Publication number
20150355118
Publication date
Dec 10, 2015
DCG Systems GmbH
Hans Heissenstein
G01 - MEASURING TESTING
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Patent Application
METHOD AND SYSTEM FOR THE EXAMINATION OF A SAMPLE BY MEANS OF THERM...
Publication number
20150339830
Publication date
Nov 26, 2015
Thermosensorik GmbH
Hans Heissenstein
G01 - MEASURING TESTING