Raimondo P. SESSEGO

Person

Chandler, AZ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Compensation and calibration of multiple mass MEMS sensor
- Patent number 10,012,673
- Issue date Jul 3, 2018
- NXP USA, INC.
- Tehmoor M. Dar
- G01 - MEASURING TESTING
Information Patent Grant
Compensation and calibration for MEMS devices
- Patent number 9,834,438
- Issue date Dec 5, 2017
- NXP USA, INC.
- Tehmoor M. Dar
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Compensation and calibration of multiple mass MEMS sensor
- Patent number 9,797,921
- Issue date Oct 24, 2017
- NXP USA, INC.
- Tehmoor M. Dar
- G01 - MEASURING TESTING
Information Patent Grant
Methodology and system for wafer-level testing of MEMS pressure sen...
- Patent number 9,527,731
- Issue date Dec 27, 2016
- NXP USA, INC.
- Bruno J. Debeurre
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
MEMS parameter identification using modulated waveforms
- Patent number 9,475,689
- Issue date Oct 25, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Raimondo P. Sessego
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Methods and apparatus for calibrating transducer-including devices
- Patent number 9,400,226
- Issue date Jul 26, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Raimondo P. Sessego
- G01 - MEASURING TESTING
Information Patent Grant
Transducer-including devices, and methods and apparatus for their c...
- Patent number 9,365,413
- Issue date Jun 14, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Andres Barrilado
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
MEMS parameter identification using modulated waveforms
- Patent number 9,335,340
- Issue date May 10, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Raimondo P. Sessego
- G01 - MEASURING TESTING
Information Patent Grant
MCU-based compensation and calibration for MEMS devices
- Patent number 9,335,396
- Issue date May 10, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Bruno Debeurre
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Compensation and calibration for MEMS devices
- Patent number 9,221,679
- Issue date Dec 29, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Tehmoor M. Dar
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Magnetic field simulator for testing singulated or multi-site strip...
- Patent number 8,878,527
- Issue date Nov 4, 2014
- Amkor Technology, Inc.
- Raimondo Sessego
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
COMPENSATION AND CALIBRATION OF MULTIPLE MASS MEMS SENSOR
- Publication number 20180003734
- Publication date Jan 4, 2018
- NXP USA, Inc.
- Tehmoor M. Dar
- G01 - MEASURING TESTING
Information Patent Application
COMPENSATION AND CALIBRATION OF MULTIPLE MASS MEMS SENSOR
- Publication number 20170067932
- Publication date Mar 9, 2017
- FREESCALE SEMICONDUCTOR, INC.
- TEHMOOR M. DAR
- G01 - MEASURING TESTING
Information Patent Application
COMPENSATION AND CALIBRATION FOR MEMS DEVICES
- Publication number 20160167961
- Publication date Jun 16, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Tehmoor M. Dar
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MEMS PARAMETER IDENTIFICATION USING MODULATED WAVEFORMS
- Publication number 20160152464
- Publication date Jun 2, 2016
- FREESCALE SEMICONDUCTOR, INC.
- RAIMONDO P. SESSEGO
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
SYSTEM FOR WAFER-LEVEL TESTING OF MEMS PRESSURE SENSORS
- Publication number 20160116361
- Publication date Apr 28, 2016
- FREESCALE SEMICONDUCTOR, INC.
- BRUNO J. DEBEURRE
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
METHODOLOGY AND SYSTEM FOR WAFER-LEVEL TESTING OF MEMS PRESSURE SEN...
- Publication number 20160107887
- Publication date Apr 21, 2016
- FREESCALE SEMICONDUCTOR, INC.
- BRUNO J. DEBEURRE
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MEMS PARAMETER IDENTIFICATION USING MODULATED WAVEFORMS
- Publication number 20150027198
- Publication date Jan 29, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Raimondo P. Sessego
- G01 - MEASURING TESTING
Information Patent Application
TRANSDUCER-INCLUDING DEVICES, AND METHODS AND APPARATUS FOR THEIR C...
- Publication number 20140352400
- Publication date Dec 4, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Andres BARRILADO
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
METHODS AND APPARATUS FOR CALIBRATING TRANSDUCER-INCLUDING DEVICES
- Publication number 20140303926
- Publication date Oct 9, 2014
- Raimondo P. Sessego
- G01 - MEASURING TESTING
Information Patent Application
COMPENSATION AND CALIBRATION FOR MEMS DEVICES
- Publication number 20140260508
- Publication date Sep 18, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Tehmoor M. Dar
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MCU-BASED COMPENSATION AND CALIBRATION FOR MEMS DEVICES
- Publication number 20140266246
- Publication date Sep 18, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Bruno Debeurre
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MAGNETIC FIELD SIMULATOR FOR TESTING SINGULATED OR MULTI-SITE STRIP...
- Publication number 20120133386
- Publication date May 31, 2012
- Raimondo Sessego
- G01 - MEASURING TESTING

Raimondo P. SESSEGO

Person

Patents Grantslast 30 patents

Compensation and calibration of multiple mass MEMS sensor

Compensation and calibration for MEMS devices

Compensation and calibration of multiple mass MEMS sensor

Methodology and system for wafer-level testing of MEMS pressure sen...

MEMS parameter identification using modulated waveforms

Methods and apparatus for calibrating transducer-including devices

Transducer-including devices, and methods and apparatus for their c...

MEMS parameter identification using modulated waveforms

MCU-based compensation and calibration for MEMS devices

Compensation and calibration for MEMS devices

Magnetic field simulator for testing singulated or multi-site strip...

Patents Applicationslast 30 patents

COMPENSATION AND CALIBRATION OF MULTIPLE MASS MEMS SENSOR

COMPENSATION AND CALIBRATION OF MULTIPLE MASS MEMS SENSOR

COMPENSATION AND CALIBRATION FOR MEMS DEVICES

MEMS PARAMETER IDENTIFICATION USING MODULATED WAVEFORMS

SYSTEM FOR WAFER-LEVEL TESTING OF MEMS PRESSURE SENSORS

METHODOLOGY AND SYSTEM FOR WAFER-LEVEL TESTING OF MEMS PRESSURE SEN...

MEMS PARAMETER IDENTIFICATION USING MODULATED WAVEFORMS

TRANSDUCER-INCLUDING DEVICES, AND METHODS AND APPARATUS FOR THEIR C...

METHODS AND APPARATUS FOR CALIBRATING TRANSDUCER-INCLUDING DEVICES

COMPENSATION AND CALIBRATION FOR MEMS DEVICES

MCU-BASED COMPENSATION AND CALIBRATION FOR MEMS DEVICES

MAGNETIC FIELD SIMULATOR FOR TESTING SINGULATED OR MULTI-SITE STRIP...