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Rainer Arnold
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Ulm, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Methods of operating particle microscopes and particle microscopes
Patent number
10,468,231
Issue date
Nov 5, 2019
Carl Zeiss Microscopy GmbH
Rainer Arnold
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for avoiding artefacts during serial block face imaging
Patent number
9,536,704
Issue date
Jan 3, 2017
Carl Zeiss Microscopy GmbH
Matthias Langer
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Method for producing a representation of an object by means of a pa...
Patent number
8,471,202
Issue date
Jun 25, 2013
Carl Zeiss Microscopy GmbH
Josef Biberger
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Particle beam systems and methods
Patent number
8,450,215
Issue date
May 28, 2013
Carl Zeiss Microscopy GmbH
Hubert Mantz
G01 - MEASURING TESTING
Information
Patent Grant
Particle beam system
Patent number
8,368,020
Issue date
Feb 5, 2013
Carl Zeiss Microscopy GmbH
Hubert Mantz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Particle beam system
Patent number
8,368,019
Issue date
Feb 5, 2013
Carl Zeiss Microscopy GmbH
Hubert Mantz
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR AVOIDING ARTEFACTS DURING SERIAL BLOCK FACE IMAGING
Publication number
20140092230
Publication date
Apr 3, 2014
Matthias Langer
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR PRODUCING A REPRESENTATION OF AN OBJECT BY MEANS OF A PA...
Publication number
20130270437
Publication date
Oct 17, 2013
Josef Biberger
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Particle Beam System
Publication number
20120025078
Publication date
Feb 2, 2012
CARL ZEISS NTS GMBH
Hubert Mantz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Particle Beam System
Publication number
20120025077
Publication date
Feb 2, 2012
CARL ZEISS NTS GMBH
Hubert Mantz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for producing a representation of an object by means of a pa...
Publication number
20110198497
Publication date
Aug 18, 2011
Josef Biberger
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Particle beam systems and methods
Publication number
20110031215
Publication date
Feb 10, 2011
Hubert Mantz
G01 - MEASURING TESTING
Information
Patent Application
Particle beam system
Publication number
20100200750
Publication date
Aug 12, 2010
Hubert Mantz
H01 - BASIC ELECTRIC ELEMENTS