Rainer Gaggl

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Patents Grantslast 30 patents

Information Patent Grant
Device for testing components under elevated gas pressure
- Patent number 11,815,542
- Issue date Nov 14, 2023
- Rainer Gaggl
- G01 - MEASURING TESTING
Information Patent Grant
Device for high voltage testing of semiconductor components
- Patent number 9,291,664
- Issue date Mar 22, 2016
- Rainer Gaggl
- G01 - MEASURING TESTING
Information Patent Grant
Process and circuit for protection of test contacts in high current...
- Patent number 7,295,021
- Issue date Nov 13, 2007
- T.I.P.S. Messtechnik GmbH
- Rainer Gaggl
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEVICE FOR TESTING COMPONENTS UNDER ELEVATED GAS PRESSURE
- Publication number 20220034955
- Publication date Feb 3, 2022
- Rainer Gaggl
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR HIGH VOLTAGE TESTING OF SEMICONDUCTOR COMPONENTS
- Publication number 20140002118
- Publication date Jan 2, 2014
- Rainer Gaggl
- G01 - MEASURING TESTING
Information Patent Application
Unknown
- Publication number 20060091898
- Publication date May 4, 2006
- Rainer Gaggl
- G01 - MEASURING TESTING