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Rainer Henkel
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Schweppenhausen, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Facility for inspecting large-volume goods, in particular freight g...
Patent number
9,158,028
Issue date
Oct 13, 2015
Smiths Heimann GmbH
Bernd Bartscher
G01 - MEASURING TESTING
Information
Patent Grant
X-ray inspection systems with enhanced brightness control
Patent number
8,406,520
Issue date
Mar 26, 2013
Smiths Heimann GmbH
Rainer Henkel
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for checking carry-on luggage and other carried o...
Patent number
8,165,267
Issue date
Apr 24, 2012
Smiths Heimann GmbH
Rainer Henkel
G01 - MEASURING TESTING
Information
Patent Grant
Method for the image optimization of an x-ray image
Patent number
6,587,595
Issue date
Jul 1, 2003
Heimann Systems GmbH
Rainer Henkel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of processing images for material recognition by X-rays
Patent number
6,198,795
Issue date
Mar 6, 2001
Heimann Systems GmbH
Dirk Naumann
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
FACILITY FOR INSPECTING LARGE-VOLUME GOODS, IN PARTICULAR FREIGHT G...
Publication number
20140016746
Publication date
Jan 16, 2014
Smiths Heimann HmbH
Bernd BARTSCHER
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR IMPROVING DETAIL DETECTABILITY IN X-RAY IMAGES
Publication number
20080089479
Publication date
Apr 17, 2008
Rainer Henkel
G01 - MEASURING TESTING
Information
Patent Application
Method and device for checking carry-on luggage and other carried o...
Publication number
20080083661
Publication date
Apr 10, 2008
Rainer Henkel
G01 - MEASURING TESTING