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Rainer Joachim STOHR
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Stuttgart, DE
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Patents Grants
last 30 patents
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Patent Grant
Processes, apparatuses and system for measuring a measured variable
Patent number
11,921,070
Issue date
Mar 5, 2024
Carl Zeiss AG
Nils Trautmann
G01 - MEASURING TESTING
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Patent Grant
Diamond probe hosting an atomic sized defect
Patent number
11,592,462
Issue date
Feb 28, 2023
President and Fellows of Harvard College
Xu Zhou
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
PROCESSES, APPARATUSES AND SYSTEM FOR MEASURING A MEASURED VARIABLE
Publication number
20220365012
Publication date
Nov 17, 2022
Carl-Zeiss AG
Nils TRAUTMANN
G01 - MEASURING TESTING
Information
Patent Application
DIAMOND PROBE HOSTING AN ATOMIC SIZED DEFECT
Publication number
20200088762
Publication date
Mar 19, 2020
President and Fellows of Harvard College
Xu ZHOU
G01 - MEASURING TESTING