Rainer Knippelmeyer

Person

Muenchen, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Objective lens arrangement usable in particle-optical systems
- Patent number 11,527,379
- Issue date Dec 13, 2022
- Carl Zeiss Microscopy GmbH
- Rainer Knippelmeyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Objective lens arrangement usable in particle-optical systems
- Patent number 10,622,184
- Issue date Apr 14, 2020
- Carl Zeiss Microscopy GmbH
- Rainer Knippelmeyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system and method of operating the same
- Patent number 10,541,112
- Issue date Jan 21, 2020
- Carl Zeiss Microscopy GmbH
- Stefan Schubert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle-optical systems and arrangements and particle-optical comp...
- Patent number 10,504,681
- Issue date Dec 10, 2019
- Carl Zeiss Microscopy GmbH
- Rainer Knippelmeyer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Charged particle inspection method and charged particle system
- Patent number 10,354,831
- Issue date Jul 16, 2019
- Carl Zeiss Microscopy GmbH
- Thomas Kemen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system and method of operating the same
- Patent number 10,121,635
- Issue date Nov 6, 2018
- Carl Zeiss Microscopy GmbH
- Stefan Schubert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle-optical systems and arrangements and particle-optical comp...
- Patent number 9,673,024
- Issue date Jun 6, 2017
- Applied Materials Israel, Ltd.
- Rainer Knippelmeyer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Focusing a charged particle system
- Patent number 9,530,613
- Issue date Dec 27, 2016
- Applied Materials Israel, Ltd.
- Steven R. Rogers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle detection system and multi-beamlet inspection system
- Patent number 9,336,981
- Issue date May 10, 2016
- Applied Materials Israel Ltd.
- Rainer Knippelmeyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle inspection method and charged particle system
- Patent number 9,324,537
- Issue date Apr 26, 2016
- Applied Materials Israel, Ltd.
- Thomas Kemen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle multi-beam inspection system and method of operati...
- Patent number 9,263,233
- Issue date Feb 16, 2016
- Carl Zeiss Microscopy GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle-optical systems and arrangements and particle-optical comp...
- Patent number 9,224,576
- Issue date Dec 29, 2015
- Carl Zeiss Microscopy GmbH
- Rainer Knippelmeyer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Focusing a charged particle imaging system
- Patent number 9,099,282
- Issue date Aug 4, 2015
- Applied Materials Israel, Ltd.
- Steven R. Rogers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reducing particle implantation
- Patent number 8,907,277
- Issue date Dec 9, 2014
- Carl Zeiss Microscopy, LLC
- Rainer Knippelmeyer
- G01 - MEASURING TESTING
Information Patent Grant
Particle-optical systems and arrangements and particle-optical comp...
- Patent number 8,637,834
- Issue date Jan 28, 2014
- Carl Zeiss Microscopy GmbH
- Rainer Knippelmeyer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Cross-section systems and methods
- Patent number 8,384,029
- Issue date Feb 26, 2013
- Carl Zeiss NTS, LLC
- Rainer Knippelmeyer
- G01 - MEASURING TESTING
Information Patent Grant
Particle-optical systems and arrangements and particle-optical comp...
- Patent number 8,097,847
- Issue date Jan 17, 2012
- Carl Ziess SMT AG
- Rainer Knippelmeyer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Charged particle-optical systems, methods and components
- Patent number 8,039,813
- Issue date Oct 18, 2011
- Carl Zeiss SMT GmbH
- Antonio Casares
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle-optical systems and arrangements and particle-optical comp...
- Patent number 7,554,094
- Issue date Jun 30, 2009
- Carl Zeiss SMT AG
- Rainer Knippelmeyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle-optical systems and arrangements and particle-optical comp...
- Patent number 7,244,949
- Issue date Jul 17, 2007
- Carl Zeiss SMT AG
- Rainer Knippelmeyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Beam guiding arrangement, imaging method, electron microscopy syste...
- Patent number 7,135,677
- Issue date Nov 14, 2006
- Carl Zeiss NTS GmbH
- Oliver Kienzle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscopy system and electron microscopy method
- Patent number 7,105,814
- Issue date Sep 12, 2006
- Carl Zeiss NTS GmbH
- Rainer Knippelmeyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detector arrangement and detection method
- Patent number 7,084,406
- Issue date Aug 1, 2006
- Carl Zeiss NTS GmbH
- Rainer Knippelmeyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for the electron-microscopic observation of a semiconductor...
- Patent number 6,967,328
- Issue date Nov 22, 2005
- Carl Zeiss NTS GmbH
- Oliver Kienzle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscopy system
- Patent number 6,946,657
- Issue date Sep 20, 2005
- Carl Zeiss NTS GmbH
- Oliver Kienzle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle-optical apparatus, electron microscopy system and electron...
- Patent number 6,914,249
- Issue date Jul 5, 2005
- Carl Zeiss NTS GmbH
- Oliver Kienzle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Examining system for the particle-optical imaging of an object, def...
- Patent number 6,903,337
- Issue date Jun 7, 2005
- Carl Zeiss SMT AG
- Oliver Kienzle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle-optical apparatus and method for operating the same
- Patent number 6,891,168
- Issue date May 10, 2005
- Carl Zeiss NTS GmbH
- Rainer Knippelmeyer
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Applications operating with beams of charged particles
- Patent number 6,878,936
- Issue date Apr 12, 2005
- Carl Zeiss NTS GmbH
- Oliver Kienzle
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
OBJECTIVE LENS ARRANGEMENT USABLE IN PARTICLE-OPTICAL SYSTEMS
- Publication number 20200243296
- Publication date Jul 30, 2020
- CARL ZEISS MICROSCOPY GMBH
- Rainer KNIPPELMEYER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM SYSTEM AND METHOD OF OPERATING THE SAME
- Publication number 20190066974
- Publication date Feb 28, 2019
- CARL ZEISS MICROSCOPY GMBH
- Stefan SCHUBERT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OBJECTIVE LENS ARRANGEMENT USABLE IN PARTICLE-OPTICAL SYSTEMS
- Publication number 20170294287
- Publication date Oct 12, 2017
- CARL ZEISS MICROSCOPY GMBH
- Rainer KNIPPELMEYER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE-OPTICAL SYSTEMS AND ARRANGEMENTS AND PARTICLE-OPTICAL COMP...
- Publication number 20170287674
- Publication date Oct 5, 2017
- CARL ZEISS MICROSCOPY GMBH
- Rainer KNIPPELMEYER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM SYSTEM AND METHOD OF OPERATING THE SAME
- Publication number 20160247663
- Publication date Aug 25, 2016
- CARL ZEISS MICROSCOPY GMBH
- Stefan SCHUBERT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE INSPECTION METHOD AND CHARGED PARTICLE SYSTEM
- Publication number 20160240344
- Publication date Aug 18, 2016
- CARL ZEISS MICROSCOPY GMBH
- Thomas KEMEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OBJECTIVE LENS ARRANGEMENT USABLE IN PARTICLE-OPTICAL SYSTEMS
- Publication number 20160181054
- Publication date Jun 23, 2016
- CARL ZEISS MICROSCOPY GMBH
- Rainer KNIPPELMEYER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE-OPTICAL SYSTEMS AND ARRANGEMENTS AND PARTICLE-OPTICAL COMP...
- Publication number 20160111251
- Publication date Apr 21, 2016
- Carl Zeiss Microscopy GmbH
- Rainer KNIPPELMEYER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FOCUSING A CHARGED PARTICLE SYSTEM
- Publication number 20150287568
- Publication date Oct 8, 2015
- Steven R. Rodgers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE MULTI-BEAM INSPECTION SYSTEM AND METHOD OF OPERATI...
- Publication number 20150090879
- Publication date Apr 2, 2015
- CARL ZEISS MICROSCOPY GMBH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE INSPECTION METHOD AND CHARGED PARTICLE SYSTEM
- Publication number 20150008331
- Publication date Jan 8, 2015
- Carl Zeiss SMT GMBH
- Thomas KEMEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FOCUSING A CHARGED PARTICLE IMAGING SYSTEM
- Publication number 20140224985
- Publication date Aug 14, 2014
- APPLIED MATERIALS ISRAEL, LTD.
- Steven R. Rodgers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Particle-Optical Systems and Arrangements and Particle-Optical Comp...
- Publication number 20140158902
- Publication date Jun 12, 2014
- APPLIED MATERIALS ISRAEL, LTD.
- Rainer Knippelmeyer
- B82 - NANO-TECHNOLOGY
Information Patent Application
Charged Particle Detection System and Multi-Beamlet Inspection System
- Publication number 20130032729
- Publication date Feb 7, 2013
- Rainer Knippelmeyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Particle-Optical Systems and Arrangements and Particle-Optical Comp...
- Publication number 20120104252
- Publication date May 3, 2012
- Applied Materials Israel Ltd.
- Rainer KNIPPELMEYER
- B82 - NANO-TECHNOLOGY
Information Patent Application
CROSS-SECTION SYSTEMS AND METHODS
- Publication number 20120085906
- Publication date Apr 12, 2012
- CARL ZEISS NTS, LLC.
- Rainer Knippelmeyer
- G01 - MEASURING TESTING
Information Patent Application
Particle-optical systems and arrangements and particle-optical comp...
- Publication number 20100181479
- Publication date Jul 22, 2010
- Rainer Knippelmeyer
- B82 - NANO-TECHNOLOGY
Information Patent Application
Charged Particle Inspection Method and Charged Particle System
- Publication number 20090256075
- Publication date Oct 15, 2009
- Carl Zeiss SMT AG
- Thomas Kemen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM EXPOSURE SYSTEM
- Publication number 20090212240
- Publication date Aug 27, 2009
- CARL ZEISS SMS GMBH
- Elmar Platzgummer
- B82 - NANO-TECHNOLOGY
Information Patent Application
Particle-Optical Component
- Publication number 20090114818
- Publication date May 7, 2009
- Carl Zeiss SMT AG
- Antonio Casares
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Particle-optical systems and arrangements and particle-optical comp...
- Publication number 20080054184
- Publication date Mar 6, 2008
- Carl Zeiss SMT AG
- Rainer Knippelmeyer
- B82 - NANO-TECHNOLOGY
Information Patent Application
Particle-optical systems and arrangements and particle-optical comp...
- Publication number 20060289804
- Publication date Dec 28, 2006
- Carl Zeiss SMT AG
- Rainer Knippelmeyer
- B82 - NANO-TECHNOLOGY
Information Patent Application
Particle-optical apparatus and method for operating the same
- Publication number 20040113092
- Publication date Jun 17, 2004
- LEO Elektronenmikroskopie GmbH
- Rainer Knippelmeyer
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Electron microscopy system
- Publication number 20040108457
- Publication date Jun 10, 2004
- LEO Elektronenmikroskopie GmbH
- Oliver Kienzle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Particle-optical apparatus, electron microscopy system and electron...
- Publication number 20040105160
- Publication date Jun 3, 2004
- LEO Elektronenmikroskopie GmbH
- Oliver Kienzle
- B82 - NANO-TECHNOLOGY
Information Patent Application
Beam guiding arrangement, imaging method, electron microscopy syste...
- Publication number 20040084621
- Publication date May 6, 2004
- LEO Elektronenmikroskopie GmbH
- Oliver Kienzle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron microscopy system and electron microscopy method
- Publication number 20040075054
- Publication date Apr 22, 2004
- LEO Elektronenmikroskopie GmbH
- Rainer Knippelmeyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for the electron-microscopic observation of a semiconductor...
- Publication number 20040065827
- Publication date Apr 8, 2004
- LEO Elektronenmikroskopie GmbH
- Oliver Kienzle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Applications operating with beams of charged particles
- Publication number 20040056193
- Publication date Mar 25, 2004
- LEO Elektronenmikroskopie GmbH
- Oliver Kienzle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Detector arrangement and detection method
- Publication number 20030116717
- Publication date Jun 26, 2003
- Rainer Knippelmeyer
- H01 - BASIC ELECTRIC ELEMENTS

Rainer Knippelmeyer

Person

Patents Grantslast 30 patents

Objective lens arrangement usable in particle-optical systems

Objective lens arrangement usable in particle-optical systems

Charged particle beam system and method of operating the same

Particle-optical systems and arrangements and particle-optical comp...

Charged particle inspection method and charged particle system

Charged particle beam system and method of operating the same

Particle-optical systems and arrangements and particle-optical comp...

Focusing a charged particle system

Charged particle detection system and multi-beamlet inspection system

Charged particle inspection method and charged particle system

Charged particle multi-beam inspection system and method of operati...

Particle-optical systems and arrangements and particle-optical comp...

Focusing a charged particle imaging system

Reducing particle implantation

Particle-optical systems and arrangements and particle-optical comp...

Cross-section systems and methods

Particle-optical systems and arrangements and particle-optical comp...

Charged particle-optical systems, methods and components

Particle-optical systems and arrangements and particle-optical comp...

Particle-optical systems and arrangements and particle-optical comp...

Beam guiding arrangement, imaging method, electron microscopy syste...

Electron microscopy system and electron microscopy method

Detector arrangement and detection method

Method for the electron-microscopic observation of a semiconductor...

Electron microscopy system

Particle-optical apparatus, electron microscopy system and electron...

Examining system for the particle-optical imaging of an object, def...

Particle-optical apparatus and method for operating the same

Applications operating with beams of charged particles

Patents Applicationslast 30 patents

OBJECTIVE LENS ARRANGEMENT USABLE IN PARTICLE-OPTICAL SYSTEMS

CHARGED PARTICLE BEAM SYSTEM AND METHOD OF OPERATING THE SAME

OBJECTIVE LENS ARRANGEMENT USABLE IN PARTICLE-OPTICAL SYSTEMS

PARTICLE-OPTICAL SYSTEMS AND ARRANGEMENTS AND PARTICLE-OPTICAL COMP...

CHARGED PARTICLE BEAM SYSTEM AND METHOD OF OPERATING THE SAME

CHARGED PARTICLE INSPECTION METHOD AND CHARGED PARTICLE SYSTEM

OBJECTIVE LENS ARRANGEMENT USABLE IN PARTICLE-OPTICAL SYSTEMS

PARTICLE-OPTICAL SYSTEMS AND ARRANGEMENTS AND PARTICLE-OPTICAL COMP...

FOCUSING A CHARGED PARTICLE SYSTEM

CHARGED PARTICLE MULTI-BEAM INSPECTION SYSTEM AND METHOD OF OPERATI...

CHARGED PARTICLE INSPECTION METHOD AND CHARGED PARTICLE SYSTEM

FOCUSING A CHARGED PARTICLE IMAGING SYSTEM

Particle-Optical Systems and Arrangements and Particle-Optical Comp...

Charged Particle Detection System and Multi-Beamlet Inspection System

Particle-Optical Systems and Arrangements and Particle-Optical Comp...

CROSS-SECTION SYSTEMS AND METHODS

Particle-optical systems and arrangements and particle-optical comp...

Charged Particle Inspection Method and Charged Particle System

CHARGED PARTICLE BEAM EXPOSURE SYSTEM

Particle-Optical Component

Particle-optical systems and arrangements and particle-optical comp...

Particle-optical systems and arrangements and particle-optical comp...

Particle-optical apparatus and method for operating the same

Electron microscopy system

Particle-optical apparatus, electron microscopy system and electron...

Beam guiding arrangement, imaging method, electron microscopy syste...

Electron microscopy system and electron microscopy method

Method for the electron-microscopic observation of a semiconductor...

Applications operating with beams of charged particles

Detector arrangement and detection method