Rainer Knippelmeyer

Person

Groton, MA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and system for charged particle microscopy with improved ima...
- Patent number 10,643,819
- Issue date May 5, 2020
- KLA-Tencor Corporation
- Doug K. Masnaghetti
- G01 - MEASURING TESTING
Information Patent Grant
Backscattered electrons (BSE) imaging using multi-beam tools
- Patent number 10,460,905
- Issue date Oct 29, 2019
- KLA-Tencor Corporation
- Mark A. McCord
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for noise mitigation in a multi-beam scanning ele...
- Patent number 10,366,862
- Issue date Jul 30, 2019
- KLA-Tencor Corporaton
- Doug K. Masnaghetti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for focus adjustment of a multi-beam scanning ele...
- Patent number 10,325,753
- Issue date Jun 18, 2019
- KLA-Tencor Corporation
- Doug K. Masnaghetti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-beam dark field imaging
- Patent number 10,192,716
- Issue date Jan 29, 2019
- KLA-Tencor Corporation
- Doug K. Masnaghetti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for focus adjustment of a multi-beam scanning ele...
- Patent number 10,186,396
- Issue date Jan 22, 2019
- KLA-Tencor Corporation
- Doug K. Masnaghetti
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Method and System for Charged Particle Microscopy with Improved Ima...
- Publication number 20200227232
- Publication date Jul 16, 2020
- KLA-Tencor Corporation
- Doug K. Masnaghetti
- G01 - MEASURING TESTING
Information Patent Application
Method and System for Focus Adjustment of a Multi-Beam Scanning Ele...
- Publication number 20190172675
- Publication date Jun 6, 2019
- KLA-Tencor Corporation
- Doug K. Masnaghetti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Field Curvature Correction for Multi-Beam Inspection Systems
- Publication number 20170229279
- Publication date Aug 10, 2017
- KLA-Tencor Corporation
- Alan Brodie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and System for Focus Adjustment of a Multi-Beam Scanning Ele...
- Publication number 20170084424
- Publication date Mar 23, 2017
- KLA-Tencor Corporation
- Doug K. Masnaghetti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and System for Noise Mitigation in a Multi-Beam Scanning Ele...
- Publication number 20170084423
- Publication date Mar 23, 2017
- KLA-Tencor Corporation
- Doug K. Masnaghetti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Backscattered Electrons (BSE) Imaging Using Multi-Beam Tools
- Publication number 20170084421
- Publication date Mar 23, 2017
- KLA-Tencor Corporation
- Mark A. McCord
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-Beam Dark Field Imaging
- Publication number 20170084422
- Publication date Mar 23, 2017
- KLA-Tencor Corporation
- Doug K. Masnaghetti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and System for Charged Particle Microscopy with Improved Ima...
- Publication number 20160372304
- Publication date Dec 22, 2016
- KLA-Tencor Corporation
- Doug K. Masnaghetti
- H01 - BASIC ELECTRIC ELEMENTS

Rainer Knippelmeyer

Person

Patents Grantslast 30 patents

Method and system for charged particle microscopy with improved ima...

Backscattered electrons (BSE) imaging using multi-beam tools

Method and system for noise mitigation in a multi-beam scanning ele...

Method and system for focus adjustment of a multi-beam scanning ele...

Multi-beam dark field imaging

Method and system for focus adjustment of a multi-beam scanning ele...

Patents Applicationslast 30 patents

Method and System for Charged Particle Microscopy with Improved Ima...

Method and System for Focus Adjustment of a Multi-Beam Scanning Ele...

Field Curvature Correction for Multi-Beam Inspection Systems

Method and System for Focus Adjustment of a Multi-Beam Scanning Ele...

Method and System for Noise Mitigation in a Multi-Beam Scanning Ele...

Backscattered Electrons (BSE) Imaging Using Multi-Beam Tools

Multi-Beam Dark Field Imaging

Method and System for Charged Particle Microscopy with Improved Ima...