Rainer Loesch

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Hockenheim, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method for manufacturing a calibrated scale in the nanometer range...
- Patent number 6,231,668
- Issue date May 15, 2001
- Deutsche Telekom AG
- Rainer Loesch
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Calibrated scale in the nanometer range for technical devices used...
- Publication number 20010018891
- Publication date Sep 6, 2001
- Deutsche Telekom AG
- Rainer Loesch
- G01 - MEASURING TESTING