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Rainer Nitsche
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Frankfurt, DE
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last 30 patents
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Patent Grant
Apparatus for analyzing samples by electromagnetic irradiation
Patent number
4,214,159
Issue date
Jul 22, 1980
Leybold-Heraeus GmbH
Franz Hillenkamp
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Sample analyzer
Patent number
4,204,117
Issue date
May 20, 1980
Leybold-Heraeus GmbH
Lothar Aberle
G01 - MEASURING TESTING