Rainer Schierle

Person

Los Altos, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Grazing and normal incidence interferometer having common reference...
- Patent number 9,273,952
- Issue date Mar 1, 2016
- KLA-Tencor Corporation
- Dieter Mueller
- G01 - MEASURING TESTING
Information Patent Grant
Grazing and normal incidence interferometer having common reference...
- Patent number 8,786,842
- Issue date Jul 22, 2014
- KLA-Tencor Corporation
- Dieter Muller
- G01 - MEASURING TESTING
Information Patent Grant
Systems configured to perform a non-contact method for determining...
- Patent number 7,719,294
- Issue date May 18, 2010
- KLA-Tencor Technologies Corp.
- Amin Samsavar
- G01 - MEASURING TESTING
Information Patent Grant
Contactless charge measurement of product wafers and control of cor...
- Patent number 7,538,333
- Issue date May 26, 2009
- KLA-Tencor Technologies Corporation
- Amin Samsavar
- G01 - MEASURING TESTING
Information Patent Grant
Contactless charge measurement of product wafers and control of cor...
- Patent number 7,248,062
- Issue date Jul 24, 2007
- KLA-Tencor Technologies Corp.
- Amin Samsavar
- G01 - MEASURING TESTING
Information Patent Grant
Reduced coherence symmetric grazing incidence differential interfer...
- Patent number 7,173,715
- Issue date Feb 6, 2007
- KLA-Tencor Corporation
- Dieter Mueller
- G01 - MEASURING TESTING
Information Patent Grant
Reduced coherence symmetric grazing incidence differential interfer...
- Patent number 7,057,741
- Issue date Jun 6, 2006
- KLA-Tencor Corporation
- Dieter Mueller
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Grazing and Normal Incidence Interferometer Having Common Reference...
- Publication number 20140333937
- Publication date Nov 13, 2014
- Dieter Mueller
- G01 - MEASURING TESTING
Information Patent Application
Reduced coherence symmetric grazing incidence differential interfer...
- Publication number 20080278732
- Publication date Nov 13, 2008
- KLA-Tencor Corporation
- Dieter Mueller
- G01 - MEASURING TESTING
Information Patent Application
Reduced coherence symmetric grazing incidence differential interfer...
- Publication number 20060126076
- Publication date Jun 15, 2006
- KLA-Tencor Corporation
- Dieter Mueller
- G01 - MEASURING TESTING

Rainer Schierle

Person

Patents Grantslast 30 patents

Grazing and normal incidence interferometer having common reference...

Grazing and normal incidence interferometer having common reference...

Systems configured to perform a non-contact method for determining...

Contactless charge measurement of product wafers and control of cor...

Contactless charge measurement of product wafers and control of cor...

Reduced coherence symmetric grazing incidence differential interfer...

Reduced coherence symmetric grazing incidence differential interfer...

Patents Applicationslast 30 patents

Grazing and Normal Incidence Interferometer Having Common Reference...

Reduced coherence symmetric grazing incidence differential interfer...

Reduced coherence symmetric grazing incidence differential interfer...