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Tokyo, JP
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last 30 patents
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Patent Grant
Imaging type X-ray microscope
Patent number
11,885,753
Issue date
Jan 30, 2024
Rigaku Corporation
Kazuhiko Omote
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
X-RAY CONTRAST MEDIUM AND X-RAY IMAGE ACQUISITION METHOD
Publication number
20240230658
Publication date
Jul 11, 2024
Rigaku Corporation
Koichiro ITO
G01 - MEASURING TESTING
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Patent Application
IMAGING TYPE X-RAY MICROSCOPE
Publication number
20220128487
Publication date
Apr 28, 2022
Rigaku Corporation
Kazuhiko OMOTE
G01 - MEASURING TESTING