Rajamani Sethuram

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San Diego, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit leakage power reduction using enhanced gated-Q s...
- Patent number 9,584,120
- Issue date Feb 28, 2017
- QUALCOMM Incorporated
- Rajamani Sethuram
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and apparatus for characterizing thermal marginality in an i...
- Patent number 9,285,418
- Issue date Mar 15, 2016
- QUALCOMM Incorporated
- Tapan J Chakraborty
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit leakage power reduction using enhanced gated-Q s...
- Patent number 8,456,193
- Issue date Jun 4, 2013
- QUALCOMM Incorporated
- Rajamani Sethuram
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR CHARACTERIZING THERMAL MARGINALITY IN AN I...
- Publication number 20130285687
- Publication date Oct 31, 2013
- QUALCOMM Incorporated
- Tapan J. Chakraborty
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT LEAKAGE POWER REDUCTION USING ENHANCED GATED-Q S...
- Publication number 20130241593
- Publication date Sep 19, 2013
- QUALCOMM Incorporated
- Rajamani Sethuram
- G01 - MEASURING TESTING
Information Patent Application
TESTING STACKED DIE
- Publication number 20130043897
- Publication date Feb 21, 2013
- QUALCOMM Incorporated
- Rajamani Sethuram
- G01 - MEASURING TESTING
Information Patent Application
Integrated Circuit Leakage Power Reduction using Enhanced Gated-Q S...
- Publication number 20120068734
- Publication date Mar 22, 2012
- QUALCOMM Incorporated
- Rajamani Sethuram
- G06 - COMPUTING CALCULATING COUNTING