Rajeev Bansal

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Willington, CT, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for the detection and location of faults and p...
- Patent number RE35561
- Issue date Jul 15, 1997
- The University of Connecticut
- Matthew S. Mashikian
- 324 - Electricity: measuring and testing
Information Patent Grant
Method and apparatus for the detection and location of faults and p...
- Patent number 5,272,439
- Issue date Dec 21, 1993
- University of Connecticut
- Matthew S. Mashikian
- G01 - MEASURING TESTING
Information Patent Grant
Method and instrumentation for the detection, location and characte...
- Patent number 4,887,041
- Issue date Dec 12, 1989
- University of Connecticut
- Matthew S. Mashikian
- G01 - MEASURING TESTING