Rajesh Chopra

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Fremont, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Programmable built-in self-test architecture
- Patent number 8,069,385
- Issue date Nov 29, 2011
- T-RAM Semiconductor, Inc.
- Rajesh Chopra
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method of integrated circuit testing
- Patent number 7,587,643
- Issue date Sep 8, 2009
- T-RAM Semiconductor, Inc.
- Rajesh Chopra
- G01 - MEASURING TESTING