Rajesh Kamana

Person

Boise, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Leakage source detection for memory with varying conductive path le...
- Patent number 11,636,911
- Issue date Apr 25, 2023
- Micron Technology, Inc.
- Amitava Majumdar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Leakage source detection by scanning access lines
- Patent number 11,081,203
- Issue date Aug 3, 2021
- Micron Technology, Inc.
- Amitava Majumdar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Non-contact measurement of memory cell threshold voltage
- Patent number 10,672,500
- Issue date Jun 2, 2020
- Micron Technology, Inc.
- Amitava Majumdar
- G11 - INFORMATION STORAGE
Information Patent Grant
Non-contact electron beam probing techniques and related structures
- Patent number 10,650,891
- Issue date May 12, 2020
- Micron Technology, Inc.
- Amitava Majumdar
- G11 - INFORMATION STORAGE
Information Patent Grant
Non-contact electron beam probing techniques and related structures
- Patent number 10,403,359
- Issue date Sep 3, 2019
- Micron Technology, Inc.
- Amitava Majumdar
- G11 - INFORMATION STORAGE
Information Patent Grant
Non-contact measurement of memory cell threshold voltage
- Patent number 10,381,101
- Issue date Aug 13, 2019
- Micron Technology, Inc.
- Amitava Majumdar
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
TEST STRUCTURES FOR A WAFER, AND ASSOCIATED DEVICES, SYSTEMS, AND M...
- Publication number 20230298951
- Publication date Sep 21, 2023
- Micron Technology, Inc.
- Chase M. Hunter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LEAKAGE SOURCE DETECTION
- Publication number 20220020446
- Publication date Jan 20, 2022
- Micron Technology, Inc.
- Amitava Majumdar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LEAKAGE SOURCE DETECTION BY SCANNING ACCESS LINES
- Publication number 20210151119
- Publication date May 20, 2021
- Micron Technology, Inc.
- Amitava Majumdar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-CONTACT ELECTRON BEAM PROBING TECHNIQUES AND RELATED STRUCTURES
- Publication number 20190355418
- Publication date Nov 21, 2019
- Micron Technology, Inc.
- Amitava Majumdar
- G11 - INFORMATION STORAGE
Information Patent Application
NON-CONTACT MEASUREMENT OF MEMORY CELL THRESHOLD VOLTAGE
- Publication number 20190341122
- Publication date Nov 7, 2019
- Micron Technology, Inc.
- Amitava Majumdar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-CONTACT MEASUREMENT OF MEMORY CELL THRESHOLD VOLTAGE
- Publication number 20190189237
- Publication date Jun 20, 2019
- Micron Technology, Inc.
- Amitava Majumdar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-CONTACT ELECTRON BEAM PROBING TECHNIQUES AND RELATED STRUCTURES
- Publication number 20190189209
- Publication date Jun 20, 2019
- Micron Technology, Inc.
- Amitava Majumdar
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor Wafer Constructions, And Methods For Quality Testing...
- Publication number 20120007073
- Publication date Jan 12, 2012
- Anjum Mehta
- H01 - BASIC ELECTRIC ELEMENTS

Rajesh Kamana

Person

Patents Grantslast 30 patents

Leakage source detection for memory with varying conductive path le...

Leakage source detection by scanning access lines

Non-contact measurement of memory cell threshold voltage

Non-contact electron beam probing techniques and related structures

Non-contact electron beam probing techniques and related structures

Non-contact measurement of memory cell threshold voltage

Patents Applicationslast 30 patents

TEST STRUCTURES FOR A WAFER, AND ASSOCIATED DEVICES, SYSTEMS, AND M...

LEAKAGE SOURCE DETECTION

LEAKAGE SOURCE DETECTION BY SCANNING ACCESS LINES

NON-CONTACT ELECTRON BEAM PROBING TECHNIQUES AND RELATED STRUCTURES

NON-CONTACT MEASUREMENT OF MEMORY CELL THRESHOLD VOLTAGE

NON-CONTACT MEASUREMENT OF MEMORY CELL THRESHOLD VOLTAGE

NON-CONTACT ELECTRON BEAM PROBING TECHNIQUES AND RELATED STRUCTURES

Semiconductor Wafer Constructions, And Methods For Quality Testing...