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Rajesh Khamankar
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Irving, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
High performance CMOS transistors using PMD liner stress
Patent number
8,809,141
Issue date
Aug 19, 2014
Texas Instruments Incorporated
Haowen Bu
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Grant
In-situ carbon doped e-SiGeCB stack for MOS transistor
Patent number
8,471,307
Issue date
Jun 25, 2013
Texas Instruments Incorporated
Rajesh B. Khamankar
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Laminated stress overlayer using In-situ multiple plasma treatments...
Patent number
8,114,784
Issue date
Feb 14, 2012
Texas Instruments Incorporated
Haowen Bu
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Nitrogen based implants for defect reduction in strained silicon
Patent number
8,084,312
Issue date
Dec 27, 2011
Texas Instruments Incorporated
Srinivasan Chakravarthi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
PMD liner nitride films and fabrication methods for improved NMOS p...
Patent number
8,084,787
Issue date
Dec 27, 2011
Texas Instruments Incorporated
Haowen Bu
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Grant
Gate structure and method
Patent number
8,021,990
Issue date
Sep 20, 2011
Texas Instruments Incorporated
Antonio L. P. Rotondaro
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods, systems and structures for forming semiconductor structure...
Patent number
7,847,401
Issue date
Dec 7, 2010
Texas Instruments Incorporated
P R Chidambaram
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Thermal treatment of nitrided oxide to improve negative bias therma...
Patent number
7,682,988
Issue date
Mar 23, 2010
Texas Instruments Incorporated
Husam N. Alshareef
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Nitrogen based implants for defect reduction in strained silicon
Patent number
7,670,892
Issue date
Mar 2, 2010
Texas Instruments Incorporated
Srinivasan Chakravarthi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Integration of pre-S/D anneal selective nitride/oxide composite cap...
Patent number
7,601,575
Issue date
Oct 13, 2009
Texas Instruments Incorporated
Haowen Bu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Reliable high voltage gate dielectric layers using a dual nitridati...
Patent number
7,560,792
Issue date
Jul 14, 2009
Texas Instruments Incorporated
Rajesh Khamankar
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods, systems and structures for forming semiconductor structure...
Patent number
7,553,718
Issue date
Jun 30, 2009
Texas Instruments Incorporated
Periannan Chidambaram
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Gate structure and method
Patent number
7,535,066
Issue date
May 19, 2009
Texas Instruments Incorporated
Antonio L. P. Rotondaro
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
CMOS device having different amounts of nitrogen in the NMOS gate d...
Patent number
7,514,308
Issue date
Apr 7, 2009
Texas Instruments Incorporated
Ajith Varghese
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Post high voltage gate oxide pattern high-vacuum outgas surface tre...
Patent number
7,402,524
Issue date
Jul 22, 2008
Texas Instruments Incorporated
Brian K. Kirkpatrick
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Gate dielectric having a flat nitrogen profile and method of manufa...
Patent number
7,345,001
Issue date
Mar 18, 2008
Texas Instruments Incorporated
Hiroaki Niimi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Dual-gate integrated circuit semiconductor device
Patent number
7,339,240
Issue date
Mar 4, 2008
Texas Instruments Incorporated
Brian K. Kirkpatrick
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
PMD liner nitride films and fabrication methods for improved NMOS p...
Patent number
7,226,834
Issue date
Jun 5, 2007
Texas Instruments Incorporated
Haowen Bu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
CMOS device having different amounts of nitrogen in the NMOS gate d...
Patent number
7,227,201
Issue date
Jun 5, 2007
Texas Instruments Incorporated
Ajith Varghese
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Transistor fabrication methods using dual sidewall spacers
Patent number
7,217,626
Issue date
May 15, 2007
Texas Instruments Incorporated
Haowen Bu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High performance CMOS transistors using PMD liner stress
Patent number
7,192,894
Issue date
Mar 20, 2007
Texas Instruments Incorporated
Haowen Bu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Reliable high voltage gate dielectric layers using a dual nitridati...
Patent number
7,183,165
Issue date
Feb 27, 2007
Texas Instruments Incorporated
Rajesh Khamankar
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Integration scheme to improve NMOS with poly cap while mitigating P...
Patent number
7,129,127
Issue date
Oct 31, 2006
Texas Instruments Incorporated
Periannan Chidambaram
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Post high voltage gate dielectric pattern plasma surface treatment
Patent number
7,049,242
Issue date
May 23, 2006
Texas Instruments Incorporated
Brian K. Kirkpatrick
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Post high voltage gate oxide pattern high-vacuum outgas surface tre...
Patent number
7,018,925
Issue date
Mar 28, 2006
Texas Instruments Incorporated
Brian K. Kirkpatrick
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Transistor fabrication methods using reduced width sidewall spacers
Patent number
7,012,028
Issue date
Mar 14, 2006
Texas Instruments Incorporated
Haowen Bu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor with a nitrided silicon gate oxide and method
Patent number
6,956,267
Issue date
Oct 18, 2005
Texas Instruments Incorporated
Sunil V. Hattangady
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Integration of pre-S/D anneal selective nitride/oxide composite cap...
Patent number
6,930,007
Issue date
Aug 16, 2005
Texas Instruments Incorporated
Haowen Bu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for improving a physical property defect value of a gate die...
Patent number
6,869,862
Issue date
Mar 22, 2005
Texas Instruments Incorporated
Brian K. Kirkpatrick
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for annealing ultra-thin, high quality gate oxide layers usi...
Patent number
6,780,719
Issue date
Aug 24, 2004
Texas Instruments Incorporated
Hiroaki Niimi
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Laminated Stress Overlayer Using In-SITU Multiple Plasma Treatments...
Publication number
20110027953
Publication date
Feb 3, 2011
TEXAS INSTRUMENTS INCORPORATED
Haowen Bu
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
Nitrogen Based Implants for Defect Reduction in Strained Silicon
Publication number
20100120215
Publication date
May 13, 2010
TEXAS INSTRUMENTS INCORPORATED
Srinivasan CHAKRAVARTHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
IN-SITU CARBON DOPED e-SiGeCB STACK FOR MOS TRANSISTOR
Publication number
20090309140
Publication date
Dec 17, 2009
TEXAS INSTRUMENTS INCORPORATED
Rajesh B. Khamankar
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Methods, Systems and Structures for Forming Semiconductor Structure...
Publication number
20090224296
Publication date
Sep 10, 2009
TEXAS INSTRUMENTS INCORPORATED
PR Chidambaram
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
GATE STRUCTURE AND METHOD
Publication number
20090227117
Publication date
Sep 10, 2009
TEXAS INSTRUMENTS INCORPORATED
Antonio L.P. Rotondaro
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Laminated Stress Overlayer Using In-SITU Multiple Plasma Treatments...
Publication number
20090152639
Publication date
Jun 18, 2009
TEXAS INSTRUMENTS INCORPORATED
Haowen Bu
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
Methodology for Reducing Post Burn-In Vmin Drift
Publication number
20090045472
Publication date
Feb 19, 2009
TEXAS INSTRUMENTS INCORPORATED
Srinivasan Chakravarthi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PMD Liner Nitride Films and Fabrication Methods for Improved NMOS P...
Publication number
20080251850
Publication date
Oct 16, 2008
TEXAS INSTRUMENTS INCORPORATED
Haowen Bu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Gate Dielectric Having a Flat Nitrogen Profile and Method of Manufa...
Publication number
20080116542
Publication date
May 22, 2008
TEXAS INSTRUMENTS INCORPORATED
Hiroaki Niimi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
REWORK METHODOLOGY THAT PRESERVES GATE PERFORMANCE
Publication number
20080076076
Publication date
Mar 27, 2008
TEXAS INSTRUMENTS INCORPORATED
Yaw Samuel Obeng
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Semiconductor device fabricated using a carbon-containing film as a...
Publication number
20070210421
Publication date
Sep 13, 2007
Texas Instruments Inc.
Haowen Bu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CMOS Device Having Different Amounts of Nitrogen in the NMOS Gate D...
Publication number
20070207572
Publication date
Sep 6, 2007
TEXAS INSTRUMENTS INCORPORATED
Ajith Varghese
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
High performance CMOS transistors using PMD liner stress
Publication number
20070128806
Publication date
Jun 7, 2007
TEXAS INSTRUMENTS INCORPORATED
Haowen Bu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Reliable high voltage gate dielectric layers using a dual nitridati...
Publication number
20070117331
Publication date
May 24, 2007
TEXAS INSTRUMENTS INCORPORATED
Rajesh Khamankar
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Nitrogen based implants for defect reduction in strained silicon
Publication number
20070105294
Publication date
May 10, 2007
TEXAS INSTRUMENTS INCORPORATED
Srinivasan Chakravarthi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Post high voltage gate dielectric pattern plasma surface treatment
Publication number
20060183337
Publication date
Aug 17, 2006
Brian K. Kirkpatrick
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Methods, systems and structures for forming semiconductor structure...
Publication number
20060172502
Publication date
Aug 3, 2006
TEXAS INSTRUMENTS INCORPORATED
PR Chidambaram
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CMOS transistors and methods of forming same
Publication number
20060154411
Publication date
Jul 13, 2006
Haowen Bu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Post high voltage gate oxide pattern high-vacuum outgas surface tre...
Publication number
20060084229
Publication date
Apr 20, 2006
Brian K. Kirkpatrick
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Integration scheme to improve NMOS with poly cap while mitigating P...
Publication number
20060068541
Publication date
Mar 30, 2006
PR Chidambaram
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CMOS device having different amounts of nitrogen in the NMOS gate d...
Publication number
20060043369
Publication date
Mar 2, 2006
TEXAS INSTRUMENTS INCORPORATED
Ajith Varghese
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Thermal treatment of nitrided oxide to improve negative bias therma...
Publication number
20060046514
Publication date
Mar 2, 2006
TEXAS INSTRUMENTS INCORPORATED
Husam N. Alshareef
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Transistor fabrication methods using dual sidewall spacers
Publication number
20060019456
Publication date
Jan 26, 2006
Haowen Bu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Transistor fabrication methods using reduced width sidewall spacers
Publication number
20060019455
Publication date
Jan 26, 2006
Haowen Bu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Gate dielectric having a flat nitrogen profile and method of manufa...
Publication number
20050285211
Publication date
Dec 29, 2005
Texas Instruments, Incorporated
Hiroaki Niimi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
High performance CMOS transistors using PMD linear stress
Publication number
20050245012
Publication date
Nov 3, 2005
Haowen Bu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PMD liner nitride films and fabrication methods for improved NMOS p...
Publication number
20050233514
Publication date
Oct 20, 2005
Haowen Bu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Integration of pre-S/D anneal selective nitride/oxide composite cap...
Publication number
20050164431
Publication date
Jul 28, 2005
Haowen Bu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for improving a physical property defect value of a gate die...
Publication number
20050156286
Publication date
Jul 21, 2005
Brian K. Kirkpatrick
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CMOS transistors and methods of forming same
Publication number
20050059260
Publication date
Mar 17, 2005
Haowen Bu
H01 - BASIC ELECTRIC ELEMENTS