Rajesh Ramachandran

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Fremont, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Wafer defect discovery
- Patent number 9,518,934
- Issue date Dec 13, 2016
- KLA-Tencor Corp.
- Hong Chen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR PRECISE DOMAIN QUESTION AND ANSWER GENERATION...
- Publication number 20170371956
- Publication date Dec 28, 2017
- International Business Machines Corporation
- Corville O. Allen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR PRECISE DOMAIN QUESTION AND ANSWER GENERATION...
- Publication number 20170371955
- Publication date Dec 28, 2017
- International Business Machines Corporation
- Corville O. Allen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Wafer Defect Discovery
- Publication number 20170076911
- Publication date Mar 16, 2017
- KLA-Tencor Corporation
- Hong Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Wafer Defect Discovery
- Publication number 20160123898
- Publication date May 5, 2016
- KLA-Tencor Corporation
- Hong Chen
- G01 - MEASURING TESTING