Rajesh Uppuluri

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Bangalore, IN

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Patents Grantslast 30 patents

Information Patent Grant
Test design optimizer for configurable scan architectures
- Patent number 8,954,918
- Issue date Feb 10, 2015
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING
Information Patent Grant
Test design optimizer for configurable scan architectures
- Patent number 8,584,073
- Issue date Nov 12, 2013
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING
Information Patent Grant
Accelerating automatic test pattern generation in a multi-core comp...
- Patent number 8,521,464
- Issue date Aug 27, 2013
- Synopsys, Inc.
- Ashwin Kumar
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST DESIGN OPTIMIZER FOR CONFIGURABLE SCAN ARCHITECTURES
- Publication number 20140059399
- Publication date Feb 27, 2014
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING
Information Patent Application
Accelerating Automatic Test Pattern Generation in a Multi-Core Comp...
- Publication number 20110301907
- Publication date Dec 8, 2011
- Synopsys, Inc.
- Ashwin Kumar
- G01 - MEASURING TESTING
Information Patent Application
TEST DESIGN OPTIMIZER FOR CONFIGURABLE SCAN ARCHITECTURES
- Publication number 20100017760
- Publication date Jan 21, 2010
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING