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Rajesh Vijayaraghavan
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Austin, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Determining die performance by incorporating neighboring die perfor...
Patent number
8,190,391
Issue date
May 29, 2012
GLOBALFOUNDRIES Inc.
Daniel Kadosh
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for identifying outliers following burn-in tes...
Patent number
8,010,310
Issue date
Aug 30, 2011
Advanced Micro Devices, Inc.
Rajesh Vijayaraghavan
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for correlating test equipment health and test...
Patent number
7,788,065
Issue date
Aug 31, 2010
GLOBALFOUNDRIES Inc.
Elfido Coss, Jr.
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for matching test equipment calibration
Patent number
7,716,004
Issue date
May 11, 2010
Advanced Micro Devices, Inc.
Elfido Coss, Jr.
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD AND APPARATUS FOR IDENTIFYING OUTLIERS FOLLOWING BURN-IN TES...
Publication number
20090027077
Publication date
Jan 29, 2009
Rajesh Vijayaraghavan
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR CORRELATING TEST EQUIPMENT HEALTH AND TEST...
Publication number
20090012737
Publication date
Jan 8, 2009
Elfido Coss, JR.
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and apparatus for matching test equipment calibration
Publication number
20090012730
Publication date
Jan 8, 2009
ELFIDO COSS, JR.
G01 - MEASURING TESTING
Information
Patent Application
USING MULTIVARIATE HEALTH METRICS TO DETERMINE MARKET SEGMENT AND T...
Publication number
20080262769
Publication date
Oct 23, 2008
DANIEL KADOSH
G01 - MEASURING TESTING
Information
Patent Application
DETERMINING DIE PERFORMANCE BY INCORPORATING NEIGHBORING DIE PERFOR...
Publication number
20080244348
Publication date
Oct 2, 2008
Daniel Kadosh
G01 - MEASURING TESTING
Information
Patent Application
Determining Die Health by Expanding Electrical Test Data to Represe...
Publication number
20080172189
Publication date
Jul 17, 2008
Daniel Kadosh
H01 - BASIC ELECTRIC ELEMENTS