Rajit Chandra

Person

Cupertino, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for integrated circuit monitoring and preventi...
- Patent number 10,591,531
- Issue date Mar 17, 2020
- QUALCOMM Incorporated
- Rajit Chandra
- G01 - MEASURING TESTING
Information Patent Grant
Thermal mitigation based on predicted temperatures
- Patent number 10,416,737
- Issue date Sep 17, 2019
- QUALCOMM Incorporated
- Rajit Chandra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Thermal mitigation of multi-core processor
- Patent number 10,114,443
- Issue date Oct 30, 2018
- QUALCOMM Incorporated
- Rajat Mittal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Thermal mitigation of multi-core processor
- Patent number 9,582,052
- Issue date Feb 28, 2017
- QUALCOMM Incorporated
- Rajat Mittal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Algorithm for preferred core sequencing to maximize performance and...
- Patent number 9,557,797
- Issue date Jan 31, 2017
- QUALCOMM Incorporated
- Rajat Mittal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for improved integrated circuit temperature ev...
- Patent number 9,323,870
- Issue date Apr 26, 2016
- Advanced Micro Devices, Inc.
- Rajit C. Chandra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Thermal simulation using adaptive 3D and hierarchical grid mechanisms
- Patent number 8,286,111
- Issue date Oct 9, 2012
- Gradient Design Automation Inc.
- Rajit Chandra
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for thermal modeling and analysis of semicondu...
- Patent number 8,082,137
- Issue date Dec 20, 2011
- Gradient Design Automation, Inc.
- Peng Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Transient thermal analysis
- Patent number 8,019,580
- Issue date Sep 13, 2011
- Gradient Design Automation Inc.
- Rajit Chandra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Thermally aware design modification
- Patent number 7,823,102
- Issue date Oct 26, 2010
- Gradient Design Automation Inc.
- Rajit Chandra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for retrofitting semiconductor chip performanc...
- Patent number 7,590,958
- Issue date Sep 15, 2009
- Gradient Design Automation, Inc.
- Rajit Chandra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for full-chip thermal analysis of semiconducto...
- Patent number 7,587,692
- Issue date Sep 8, 2009
- Gradient Design Automation, Inc.
- Rajit Chandra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor chip design having thermal awareness across multiple...
- Patent number 7,472,363
- Issue date Dec 30, 2008
- Gradient Design Automation Inc.
- Rajit Chandra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for normalizing thermal gradients over semicon...
- Patent number 7,458,052
- Issue date Nov 25, 2008
- Gradient Design Automation, Inc.
- Rajit Chandra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for thermal modeling and analysis of semicondu...
- Patent number 7,401,304
- Issue date Jul 15, 2008
- Gradient Design Automation Inc.
- Peng Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for optimizing thermal management system perfo...
- Patent number 7,383,520
- Issue date Jun 3, 2008
- Gradient Design Automation Inc.
- Rajit Chandra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for using full-chip thermal analysis of semico...
- Patent number 7,353,471
- Issue date Apr 1, 2008
- Gradient Design Automation Inc.
- Rajit Chandra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for retrofitting semiconductor chip performanc...
- Patent number 7,203,920
- Issue date Apr 10, 2007
- Gradient Design Automation Inc.
- Rajit Chandra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for full-chip thermal analysis of semiconducto...
- Patent number 7,194,711
- Issue date Mar 20, 2007
- Gradient Design Automation Inc.
- Rajit Chandra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for thermal testing of semiconductor chip designs
- Patent number 7,191,413
- Issue date Mar 13, 2007
- Gradient Design Automation, Inc.
- Rajit Chandra
- G01 - MEASURING TESTING
Information Patent Grant
System and method for performing assertion-based analysis of circui...
- Patent number 6,591,402
- Issue date Jul 8, 2003
- Moscape, Inc.
- Rajit Chandra
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
THERMAL MITIGATION OF MULTI-CORE PROCESSOR
- Publication number 20170160785
- Publication date Jun 8, 2017
- QUALCOMM Incorporated
- Rajat MITTAL
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR INTEGRATED CIRCUIT MONITORING AND PREVENTI...
- Publication number 20160363623
- Publication date Dec 15, 2016
- QUALCOMM Incorporated
- Rajit CHANDRA
- G01 - MEASURING TESTING
Information Patent Application
THERMAL MITIGATION BASED ON EVENT COUNTER
- Publication number 20160139589
- Publication date May 19, 2016
- QUALCOMM Incorporated
- Rajit CHANDRA
- G05 - CONTROLLING REGULATING
Information Patent Application
THERMAL MITIGATION BASED ON PREDICATED TEMPERATURES
- Publication number 20160124475
- Publication date May 5, 2016
- QUALCOMM Incorporated
- Rajit CHANDRA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THERMAL MITIGATION OF MULTI-CORE PROCESSOR
- Publication number 20160124476
- Publication date May 5, 2016
- QUALCOMM Incorporated
- Rajat MITTAL
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Algorithm For Preferred Core Sequencing To Maximize Performance And...
- Publication number 20150338902
- Publication date Nov 26, 2015
- QUALCOMM Incorporated
- Rajat MITTAL
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTROMIGRATION ANALYSIS FOR STANDARD CELL BASED DESIGNS
- Publication number 20140181780
- Publication date Jun 26, 2014
- Advanced Micro Devices, Inc.
- Thomas D. Burd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR IMPROVED INTEGRATED CIRCUIT TEMPERATURE EV...
- Publication number 20130298101
- Publication date Nov 7, 2013
- Advanced Micro Devices, Inc.
- Rajit C. Chandra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for thermally aware design improvement
- Publication number 20090224356
- Publication date Sep 10, 2009
- Rajit Chandra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ACCELERATED LIFE TESTING OF SEMICONDUCTOR CHIPS
- Publication number 20090077508
- Publication date Mar 19, 2009
- Daniel I. Rubin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for generating thermal test vectors
- Publication number 20090048801
- Publication date Feb 19, 2009
- Rajit Chandra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR NORMALIZING THERMAL GRADIENTS OVER SEMICON...
- Publication number 20090044156
- Publication date Feb 12, 2009
- Rajit Chandra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Thermal Simulation Using Adaptive 3D and Hierarchical Grid Mechanisms
- Publication number 20090024347
- Publication date Jan 22, 2009
- Rajit Chandra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR CHIP DESIGN HAVING THERMAL AWARENESS ACROSS MULTIPLE...
- Publication number 20090024969
- Publication date Jan 22, 2009
- Rajit Chandra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Thermally Aware Design Modification
- Publication number 20090019411
- Publication date Jan 15, 2009
- Rajit Chandra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR THERMAL MODELING AND ANALYSIS OF SEMICONDU...
- Publication number 20080243461
- Publication date Oct 2, 2008
- Peng Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR OPTIMIZING THERMAL MANAGEMENT SYSTEM PERFO...
- Publication number 20080163135
- Publication date Jul 3, 2008
- RAJIT CHANDRA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR USING FULL-CHIP THERMAL ANALYSIS OF SEMICO...
- Publication number 20080141192
- Publication date Jun 12, 2008
- RAJIT CHANDRA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR OPTIMIZING THERMAL MANAGEMENT SYSTEM PERFO...
- Publication number 20080066022
- Publication date Mar 13, 2008
- Gradient Design Automation, Inc.
- Rajit Chandra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR RETROFITTING SEMICONDUCTOR CHIP PERFORMANC...
- Publication number 20070157137
- Publication date Jul 5, 2007
- Rajit Chandra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR FULL-CHIP THERMAL ANALYSIS OF SEMICONDUCTO...
- Publication number 20070120239
- Publication date May 31, 2007
- Rajit Chandra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for full-chip thermal analysis of semiconducto...
- Publication number 20060095876
- Publication date May 4, 2006
- Rajit Chandra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for thermal modeling and analysis of semicondu...
- Publication number 20060031794
- Publication date Feb 9, 2006
- Peng Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for thermal testing of semiconductor chip designs
- Publication number 20050166166
- Publication date Jul 28, 2005
- Gradient Design Automation
- Rajit Chandra
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for retrofitting semiconductor chip performanc...
- Publication number 20050166168
- Publication date Jul 28, 2005
- Gradient Design Automation
- Rajit Chandra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Formal automated methodology for optimal signal integrity character...
- Publication number 20030145296
- Publication date Jul 31, 2003
- Rajit Chandra
- G06 - COMPUTING CALCULATING COUNTING

Rajit Chandra

Person

Patents Grantslast 30 patents

Method and apparatus for integrated circuit monitoring and preventi...

Thermal mitigation based on predicted temperatures

Thermal mitigation of multi-core processor

Thermal mitigation of multi-core processor

Algorithm for preferred core sequencing to maximize performance and...

Method and apparatus for improved integrated circuit temperature ev...

Thermal simulation using adaptive 3D and hierarchical grid mechanisms

Method and apparatus for thermal modeling and analysis of semicondu...

Transient thermal analysis

Thermally aware design modification

Method and apparatus for retrofitting semiconductor chip performanc...

Method and apparatus for full-chip thermal analysis of semiconducto...

Semiconductor chip design having thermal awareness across multiple...

Method and apparatus for normalizing thermal gradients over semicon...

Method and apparatus for thermal modeling and analysis of semicondu...

Method and apparatus for optimizing thermal management system perfo...

Method and apparatus for using full-chip thermal analysis of semico...

Method and apparatus for retrofitting semiconductor chip performanc...

Method and apparatus for full-chip thermal analysis of semiconducto...

Method and apparatus for thermal testing of semiconductor chip designs

System and method for performing assertion-based analysis of circui...

Patents Applicationslast 30 patents

THERMAL MITIGATION OF MULTI-CORE PROCESSOR

METHOD AND APPARATUS FOR INTEGRATED CIRCUIT MONITORING AND PREVENTI...

THERMAL MITIGATION BASED ON EVENT COUNTER

THERMAL MITIGATION BASED ON PREDICATED TEMPERATURES

THERMAL MITIGATION OF MULTI-CORE PROCESSOR

Algorithm For Preferred Core Sequencing To Maximize Performance And...

ELECTROMIGRATION ANALYSIS FOR STANDARD CELL BASED DESIGNS

METHOD AND APPARATUS FOR IMPROVED INTEGRATED CIRCUIT TEMPERATURE EV...

Method and apparatus for thermally aware design improvement

ACCELERATED LIFE TESTING OF SEMICONDUCTOR CHIPS

Method and apparatus for generating thermal test vectors

METHOD AND APPARATUS FOR NORMALIZING THERMAL GRADIENTS OVER SEMICON...

Thermal Simulation Using Adaptive 3D and Hierarchical Grid Mechanisms

SEMICONDUCTOR CHIP DESIGN HAVING THERMAL AWARENESS ACROSS MULTIPLE...

Thermally Aware Design Modification

METHOD AND APPARATUS FOR THERMAL MODELING AND ANALYSIS OF SEMICONDU...

METHOD AND APPARATUS FOR OPTIMIZING THERMAL MANAGEMENT SYSTEM PERFO...

METHOD AND APPARATUS FOR USING FULL-CHIP THERMAL ANALYSIS OF SEMICO...

METHOD AND APPARATUS FOR OPTIMIZING THERMAL MANAGEMENT SYSTEM PERFO...

METHOD AND APPARATUS FOR RETROFITTING SEMICONDUCTOR CHIP PERFORMANC...

METHOD AND APPARATUS FOR FULL-CHIP THERMAL ANALYSIS OF SEMICONDUCTO...

Method and apparatus for full-chip thermal analysis of semiconducto...

Method and apparatus for thermal modeling and analysis of semicondu...

Method and apparatus for thermal testing of semiconductor chip designs

Method and apparatus for retrofitting semiconductor chip performanc...

Formal automated methodology for optimal signal integrity character...