Rajiv Giridharagopal

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Portland, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Visible laser probing for circuit debug and defect analysis
- Patent number 9,651,610
- Issue date May 16, 2017
- Intel Corporation
- Travis M. Eiles
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
VISIBLE LASER PROBING FOR CIRCUIT DEBUG AND DEFECT ANALYSIS
- Publication number 20150002182
- Publication date Jan 1, 2015
- Travis M. Eiles
- G01 - MEASURING TESTING