Rakesh Pandey

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Ghaziabad, IN, US

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Patents Grantslast 30 patents

Information Patent Grant
Integrated circuits and methods for dynamic allocation of one-time...
- Patent number 11,551,769
- Issue date Jan 10, 2023
- NXP USA, INC.
- Rakesh Pandey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Active tamper detection circuit with bypass detection and method th...
- Patent number 10,242,955
- Issue date Mar 26, 2019
- NXP USA, INC.
- Mohit Arora
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuits and methods for dynamic allocation of one-time...
- Patent number 10,020,067
- Issue date Jul 10, 2018
- NXP USA, INC.
- Rakesh Pandey
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for determining feasibility of memory operatin...
- Patent number 9,817,601
- Issue date Nov 14, 2017
- NXP USA, INC.
- Shayan Zhang
- G11 - INFORMATION STORAGE
Information Patent Grant
System for preventing tampering with integrated circuit
- Patent number 9,455,233
- Issue date Sep 27, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Rishi Bhooshan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Data strobe signal generation for flash memory
- Patent number 9,251,906
- Issue date Feb 2, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Aarul Jain
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED CIRCUITS AND METHODS FOR DYNAMIC ALLOCATION OF ONE-TIME...
- Publication number 20180286489
- Publication date Oct 4, 2018
- NXP USA, Inc.
- Rakesh PANDEY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUITS AND METHODS FOR DYNAMIC ALLOCATION OF ONE-TIME...
- Publication number 20180060164
- Publication date Mar 1, 2018
- FREESCALE SEMICONDUCTOR, INC.
- Rakesh PANDEY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ACTIVE TAMPER DETECTION CIRCUIT WITH BYPASS DETECTION AND METHOD TH...
- Publication number 20180061780
- Publication date Mar 1, 2018
- FREESCALE SEMICONDUCTOR, INC.
- MOHIT ARORA
- G01 - MEASURING TESTING
Information Patent Application
PROCESSOR SWITCHABLE BETWEEN TEST AND DEBUG MODES
- Publication number 20140108876
- Publication date Apr 17, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Akshay K. Pathak
- G01 - MEASURING TESTING