Rakesh Poddar

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Santa Clara, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Scanning probe having integrated silicon tip with cantilever
- Patent number 8,828,243
- Issue date Sep 9, 2014
- Applied Nanostructures, Inc.
- Rakesh Poddar
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
Scanning probe having integrated silicon tip with cantilever
- Publication number 20120060244
- Publication date Mar 8, 2012
- Applied NanoStructures, Inc.
- Rakesh Poddar
- G01 - MEASURING TESTING