Rakesh RANJAN

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Mechanicsville, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for quantifying defects due to through silicon...
- Patent number 9,335,368
- Issue date May 10, 2016
- GLOBALFOUNDRIES Inc.
- Luigi Pantisano
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR QUANTIFYING DEFECTS DUE TO THROUGH SILICON...
- Publication number 20160116526
- Publication date Apr 28, 2016
- GLOBAL FOUNDRIES Inc.
- Luigi PANTISANO
- G01 - MEASURING TESTING