Ralf ARNOLD

Person

Poing, DE

People

Patents Grantslast 30 patents

Information Patent Grant
High accurate contact resistance measurement method using one or mo...
- Patent number 11,555,844
- Issue date Jan 17, 2023
- Infineon Technologies AG
- Ralf Arnold
- G01 - MEASURING TESTING
Information Patent Grant
Signal generating circuit
- Patent number 8,860,592
- Issue date Oct 14, 2014
- Infineon Technologies AG
- Heinz Mattes
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Electronic element comprising an electronic circuit which is to be...
- Patent number 7,640,469
- Issue date Dec 29, 2009
- Infineon Technologies AG
- Ralf Arnold
- G01 - MEASURING TESTING
Information Patent Grant
Input and output circuit of an integrated circuit and a method for...
- Patent number 7,453,282
- Issue date Nov 18, 2008
- Infineon Technologies AG
- Ralf Arnold
- G01 - MEASURING TESTING
Information Patent Grant
System for testing digital components
- Patent number 7,386,776
- Issue date Jun 10, 2008
- Infineon Technologies AG
- Ralf Arnold
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus with low-reflection signal distribution
- Patent number 7,355,414
- Issue date Apr 8, 2008
- Infineon Technologies, AG
- Ralf Arnold
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor circuit device and a system for testing a semiconduct...
- Patent number 7,331,005
- Issue date Feb 12, 2008
- Infineon Technologies AG
- Ralf Arnold
- G01 - MEASURING TESTING
Information Patent Grant
Input switching arrangement for a semiconductor circuit and test me...
- Patent number 7,308,628
- Issue date Dec 11, 2007
- Infineon Technologies, AG
- Wolfgang Spirkl
- G11 - INFORMATION STORAGE
Information Patent Grant
Configurable processing block capable of interacting with external...
- Patent number 7,028,162
- Issue date Apr 11, 2006
- Siemens Aktiengesellschaft
- Ralf Arnold
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for configuring a configurable hardware block by configuring...
- Patent number 6,996,709
- Issue date Feb 7, 2006
- Infineon Technologies AG
- Ralf Arnold
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for testing a program-controlled unit by an external test de...
- Patent number 6,885,963
- Issue date Apr 26, 2005
- Infineon Technologies AG
- Ralf Arnold
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
CONTACT RESISTANCE MEASUREMENT METHOD
- Publication number 20250076355
- Publication date Mar 6, 2025
- INFINEON TECHNOLOGIES AG
- Ralf Arnold
- G01 - MEASURING TESTING
Information Patent Application
HIGH ACCURATE CONTACT RESISTANCE MEASUREMENT METHOD USING ONE OR MO...
- Publication number 20200003824
- Publication date Jan 2, 2020
- INFINEON TECHNOLOGIES AG
- RALF ARNOLD
- G01 - MEASURING TESTING
Information Patent Application
TEST CIRCUIT
- Publication number 20140098847
- Publication date Apr 10, 2014
- Heinz MATTES
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SIGNAL GENERATING CIRCUIT
- Publication number 20140097976
- Publication date Apr 10, 2014
- Heinz MATTES
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Input and output circuit an integrated circuit and method for testi...
- Publication number 20060273820
- Publication date Dec 7, 2006
- Ralf Arnold
- G01 - MEASURING TESTING
Information Patent Application
Test apparatus with low-reflection signal distribution
- Publication number 20060186896
- Publication date Aug 24, 2006
- Ralf Arnold
- G01 - MEASURING TESTING
Information Patent Application
Electronic element comprising an electronic circuit which is to be...
- Publication number 20060190792
- Publication date Aug 24, 2006
- Ralf Arnold
- G01 - MEASURING TESTING
Information Patent Application
System for testing digital components
- Publication number 20060069951
- Publication date Mar 30, 2006
- Ralf Arnold
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor circuit device and a system for testing a semiconduct...
- Publication number 20060026475
- Publication date Feb 2, 2006
- Ralf Arnold
- G01 - MEASURING TESTING
Information Patent Application
Input switching arrangement for a semiconductor circuit and test me...
- Publication number 20050108603
- Publication date May 19, 2005
- Wolfgang Spirkl
- G01 - MEASURING TESTING
Information Patent Application
Method for testing a program-controlled unit by an external test de...
- Publication number 20020065624
- Publication date May 30, 2002
- Ralf Arnold
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Configurable hardware block
- Publication number 20020013891
- Publication date Jan 31, 2002
- Ralf Arnold
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for configuring a configurable hardware block
- Publication number 20020010852
- Publication date Jan 24, 2002
- Ralf Arnold
- G06 - COMPUTING CALCULATING COUNTING

Ralf ARNOLD

Person

Patents Grantslast 30 patents

High accurate contact resistance measurement method using one or mo...

Signal generating circuit

Electronic element comprising an electronic circuit which is to be...

Input and output circuit of an integrated circuit and a method for...

System for testing digital components

Test apparatus with low-reflection signal distribution

Semiconductor circuit device and a system for testing a semiconduct...

Input switching arrangement for a semiconductor circuit and test me...

Configurable processing block capable of interacting with external...

Method for configuring a configurable hardware block by configuring...

Method for testing a program-controlled unit by an external test de...

Patents Applicationslast 30 patents

CONTACT RESISTANCE MEASUREMENT METHOD

HIGH ACCURATE CONTACT RESISTANCE MEASUREMENT METHOD USING ONE OR MO...

TEST CIRCUIT

SIGNAL GENERATING CIRCUIT

Input and output circuit an integrated circuit and method for testi...

Test apparatus with low-reflection signal distribution

Electronic element comprising an electronic circuit which is to be...

System for testing digital components

Semiconductor circuit device and a system for testing a semiconduct...

Input switching arrangement for a semiconductor circuit and test me...

Method for testing a program-controlled unit by an external test de...

Configurable hardware block

Method for configuring a configurable hardware block