Ralf Degenhardt

Person

Heimstetten, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam device with retarding field analyzer
- Patent number 8,203,119
- Issue date Jun 19, 2012
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Ralf Degenhardt
- G01 - MEASURING TESTING
Information Patent Grant
Double stage charged particle beam energy width reduction system fo...
- Patent number 7,679,054
- Issue date Mar 16, 2010
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Jürgen Frosien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam energy width reduction system for charged par...
- Patent number 7,507,956
- Issue date Mar 24, 2009
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Jürgen Frosien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Single stage charged particle beam energy width reduction system fo...
- Patent number 7,468,517
- Issue date Dec 23, 2008
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiternruftechnik mbH
- Jürgen Frosien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electric-magnetic field-generating element and assembling method fo...
- Patent number 7,429,740
- Issue date Sep 30, 2008
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Carlo Salvesen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging apparatus for high probe currents
- Patent number 7,361,897
- Issue date Apr 22, 2008
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Ralf Degenhardt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and method for operating the same
- Patent number 7,274,018
- Issue date Sep 25, 2007
- ICT, Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Pavel Adamec
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and method for operating the same
- Patent number 7,045,781
- Issue date May 16, 2006
- ICT, Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik Mbh
- Pavel Adamec
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi beam charged particle device
- Patent number 6,943,349
- Issue date Sep 13, 2005
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Pavel Adamec
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Beam column for charged particle beam device
- Patent number 6,576,908
- Issue date Jun 10, 2003
- Applied Materials, Inc.
- Dieter Winkler
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Charged Particle Beam Device With Retarding Field Analyzer
- Publication number 20090200463
- Publication date Aug 13, 2009
- Ralf Degenhardt
- G01 - MEASURING TESTING
Information Patent Application
Double Stage Charged Particle Beam Energy Width Reduction System Fo...
- Publication number 20070200069
- Publication date Aug 30, 2007
- Jürgen Frosien
- B82 - NANO-TECHNOLOGY
Information Patent Application
Single stage charged particle beam energy width reduction system fo...
- Publication number 20070158561
- Publication date Jul 12, 2007
- Jurgen Frosien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam energy width reduction system for charged par...
- Publication number 20070069150
- Publication date Mar 29, 2007
- Jürgen Frosien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electric-magnetic field-generating element and assembling method fo...
- Publication number 20070023673
- Publication date Feb 1, 2007
- ICT. INTEGRATED CIRCUIT TESTING GESELLSCHAFT FUR HALBLEITERPRUFTECHNIK MBH
- Carlo Salvesen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Imaging apparatus for high probe currents
- Publication number 20060219915
- Publication date Oct 5, 2006
- Ralf Degenhardt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam apparatus and method for operating the same
- Publication number 20060192145
- Publication date Aug 31, 2006
- ICT. INTEGRATED CIRCUIT TESTING GESELLSCHAFT FUR HALBLEITERPRUFTECHNIK MBH
- Pavel Adamec
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam apparatus and method for operating the same
- Publication number 20040169141
- Publication date Sep 2, 2004
- Pavel Adamec
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi beam charged particle device
- Publication number 20030168606
- Publication date Sep 11, 2003
- Pavel Adamec
- H01 - BASIC ELECTRIC ELEMENTS

Ralf Degenhardt

Person

Patents Grantslast 30 patents

Charged particle beam device with retarding field analyzer

Double stage charged particle beam energy width reduction system fo...

Charged particle beam energy width reduction system for charged par...

Single stage charged particle beam energy width reduction system fo...

Electric-magnetic field-generating element and assembling method fo...

Imaging apparatus for high probe currents

Charged particle beam apparatus and method for operating the same

Charged particle beam apparatus and method for operating the same

Multi beam charged particle device

Beam column for charged particle beam device

Patents Applicationslast 30 patents

Charged Particle Beam Device With Retarding Field Analyzer

Double Stage Charged Particle Beam Energy Width Reduction System Fo...

Single stage charged particle beam energy width reduction system fo...

Charged particle beam energy width reduction system for charged par...

Electric-magnetic field-generating element and assembling method fo...

Imaging apparatus for high probe currents

Charged particle beam apparatus and method for operating the same

Charged particle beam apparatus and method for operating the same

Multi beam charged particle device