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Ralf Engels
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Huertgenwald, DE
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Patents Grants
last 30 patents
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Patent Grant
Scintillation detector with a high count rate
Patent number
10,451,750
Issue date
Oct 22, 2019
Forschungszentrum Julich GmbH
Sebastian Jaksch
G01 - MEASURING TESTING
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Patent Grant
Evaluation unit to evaluate detector events
Patent number
6,605,809
Issue date
Aug 12, 2003
Forschungszentrum Julich GmbH
Ralf Engels
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
SCINTILLATION DETECTOR WITH A HIGH COUNT RATE
Publication number
20170329027
Publication date
Nov 16, 2017
Sebastian JAKSCH
G01 - MEASURING TESTING
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Patent Application
POSITION-DETERMINING SYSTEM AND METHOD FOR THE OPERATION THEREOF
Publication number
20140111379
Publication date
Apr 24, 2014
FORSCHUNGSZENTRUM JUELICH GMBH
Jakob Schelten
G01 - MEASURING TESTING