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Ralf Haeussler
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Gaertringen, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Wavelength tunable laser source with parameter correction
Patent number
7,430,227
Issue date
Sep 30, 2008
Agilent Technologies, Inc.
Michael Schubert
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for monitoring an interferometer
Patent number
7,423,760
Issue date
Sep 9, 2008
Agilent Technologies, Inc.
Wolf Steffens
G01 - MEASURING TESTING
Information
Patent Grant
Tuning a laser
Patent number
6,763,044
Issue date
Jul 13, 2004
Agilent Technologies, Inc.
Emmerich Mueller
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Sweep Speed Compensation
Publication number
20080219301
Publication date
Sep 11, 2008
Wolf Steffens
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Interferometer monitoring
Publication number
20060119857
Publication date
Jun 8, 2006
Wolf Steffens
G01 - MEASURING TESTING
Information
Patent Application
Wavelength tunable laser source with parameter correction
Publication number
20050232315
Publication date
Oct 20, 2005
Michael Schubert
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Tuning a laser
Publication number
20030048816
Publication date
Mar 13, 2003
AGILENT TECHNOLOGIES, INC.
Emmerich Mueller
H01 - BASIC ELECTRIC ELEMENTS