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Ralf Hartmer
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Hamburg, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Acquisition of fragment ion mass spectra of biopolymers in mixtures
Patent number
9,595,427
Issue date
Mar 14, 2017
Jens Decker
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Alpha- and chi-diketone reactants for charge transfer reactions in...
Patent number
9,557,297
Issue date
Jan 31, 2017
Bruker Daltonik GmbH
Ralf Hartmer
C07 - ORGANIC CHEMISTRY
Information
Patent Grant
Multi-nozzle chip for electrospray ionization in mass spectrometers
Patent number
9,242,258
Issue date
Jan 26, 2016
Andreas Brekenfeld
B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information
Patent Grant
Ejection of ion clouds from 3D RF ion traps
Patent number
8,901,491
Issue date
Dec 2, 2014
Bruker Daltonik, GmbH
Andreas Brekenfeld
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Radical ions for electron transfer dissociation
Patent number
8,604,426
Issue date
Dec 10, 2013
Bruker Daltonik GmbH
Ralf Hartmer
G01 - MEASURING TESTING
Information
Patent Grant
Radical anions for electron transfer dissociation
Patent number
8,461,522
Issue date
Jun 11, 2013
Bruker Daltonik, GmbH
Ralf Hartmer
G01 - MEASURING TESTING
Information
Patent Grant
Proteome analysis in mass spectrometers containing RF ion traps
Patent number
8,426,155
Issue date
Apr 23, 2013
Bruker Daltonik, GmbH
Ralf Hartmer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Isolation of ions in overloaded RF ion traps
Patent number
8,324,566
Issue date
Dec 4, 2012
Bruker Daltonik GmbH
Desmond Allen Kaplan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Fragmentation of analyte ions by collisions in RF ion traps
Patent number
8,198,583
Issue date
Jun 12, 2012
Bruker Daltonik GmbH
Andreas Brekenfeld
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Top-down protein analysis in mass spectrometers with ion traps
Patent number
7,642,509
Issue date
Jan 5, 2010
Bruker Daltonik GmbH
Ralf Hartmer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Feedback fragmentation in ion trap mass spectrometers
Patent number
7,586,089
Issue date
Sep 8, 2009
Bruker Daltonik GmbH
Ralf Hartmer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion source for electron transfer dissociation and deprotonation
Patent number
7,582,862
Issue date
Sep 1, 2009
Bruker Daltonik GmbH
Ralf Hartmer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion fragmentation by electron transfer in ion traps
Patent number
7,456,397
Issue date
Nov 25, 2008
Bruker Daltonik GmbH
Ralf Hartmer
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
STRUCTURAL ELUCIDATION OF INTACT HEAVY MOLECULES AND MOLECULAR COMP...
Publication number
20170110302
Publication date
Apr 20, 2017
Bruker Daltonik GmbH
Ralf Hartmer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ACQUISITION OF FRAGMENT ION MASS SPECTRA OF BIOPOLYMERS IN MIXTURES
Publication number
20150214020
Publication date
Jul 30, 2015
Bruker Daltonik GmbH
Jens DECKER
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MULTI-NOZZLE CHIP FOR ELECTROSPRAY IONIZATION IN MASS SPECTROMETERS
Publication number
20140284406
Publication date
Sep 25, 2014
Andreas BREKENFELD
B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information
Patent Application
EJECTION OF ION CLOUDS FROM 3D RF ION TRAPS
Publication number
20140008533
Publication date
Jan 9, 2014
Andreas Brekenfeld
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
RADICAL IONS FOR ELECTRON TRANSFER DISSOCIATION
Publication number
20130164174
Publication date
Jun 27, 2013
Bruker Daltonik, GmbH
Ralf Hartmer
G01 - MEASURING TESTING
Information
Patent Application
REACTANTS FOR CHARGE TRANSFER REACTIONS IN MASS SPECTROMETERS
Publication number
20130115711
Publication date
May 9, 2013
Bruker Daltonik GmbH
Ralf Hartmer
G01 - MEASURING TESTING
Information
Patent Application
ISOLATION OF IONS IN OVERLOADED RF ION TRAPS
Publication number
20120223222
Publication date
Sep 6, 2012
Bruker Daltonik GmbH
Desmond Allen Kaplan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PROTEOME ANALYSIS IN MASS SPECTROMETERS CONTAINING RF ION TRAPS
Publication number
20120156707
Publication date
Jun 21, 2012
Bruker Daltonik GmbH
Ralf Hartmer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
RADICAL ANIONS FOR ELECTRON TRANSFER DISSOCIATION
Publication number
20100140466
Publication date
Jun 10, 2010
Bruker Daltonik GmbH
Ralf Hartmer
G01 - MEASURING TESTING
Information
Patent Application
FRAGMENTATION OF ANALYTE IONS BY COLLISIONS IN RF ION TRAPS
Publication number
20090283672
Publication date
Nov 19, 2009
Bruker Daltonik GmbH
Andreas Brekenfeld
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TOP-DOWN PROTEIN ANALYSIS IN MASS SPECTROMETERS WITH ION TRAPS
Publication number
20080093547
Publication date
Apr 24, 2008
Bruker Daltonik GmbH
Ralf Hartmer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION SOURCE FOR ELECTRON TRANSFER DISSOCIATION AND DEPROTONATION
Publication number
20080093546
Publication date
Apr 24, 2008
Bruker Daltonik GmbH
Ralf Hartmer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Ion fragmentation by electron transfer in ion traps
Publication number
20060186331
Publication date
Aug 24, 2006
Bruker Daltonik GmbH
Ralf Hartmer
H01 - BASIC ELECTRIC ELEMENTS