Ralf Janke

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Gundelfingen, DE

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Patents Grantslast 30 patents

Information Patent Grant
Measurement device for measuring a magnetic field
- Patent number 8,067,934
- Issue date Nov 29, 2011
- Micronas GmbH
- Ralf Janke
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing a hall magnetic field sensor on a...
- Patent number 7,492,178
- Issue date Feb 17, 2009
- Micronas GmbH
- Reiner Bidenbach
- G01 - MEASURING TESTING
Information Patent Grant
Sensor system with variable sensor-signal processing
- Patent number 7,139,682
- Issue date Nov 21, 2006
- Micronas GmbH
- Ralf Janke
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit with a sensor element for providing an encoded o...
- Patent number 6,847,206
- Issue date Jan 25, 2005
- Micronas GmbH
- Lothar Blossfeld
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Process for monitoring the function of a sensor module and a sensor...
- Patent number 6,424,143
- Issue date Jul 23, 2002
- Micronas GmbH
- Lothar Blossfeld
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Measurement Device for Measuring a Magnetic Field
- Publication number 20090140726
- Publication date Jun 4, 2009
- Micronas GmbH
- Ralf Janke
- G01 - MEASURING TESTING
Information Patent Application
Method for testing a hall magnetic field sensor on a wafer
- Publication number 20060284612
- Publication date Dec 21, 2006
- Reiner Bidenbach
- G01 - MEASURING TESTING
Information Patent Application
Sensor system with variable sensor-signal processing
- Publication number 20020099523
- Publication date Jul 25, 2002
- Ralf Janke
- G01 - MEASURING TESTING