TREA

Ralf Lenke

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  • Lauchheim, DE
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Patents Grantslast 30 patents

  • Information Patent Grant

    Particle beam system and the use thereof for flexibly setting the c...
    • Patent number 12,119,204
    • Issue date Oct 15, 2024
    • Carl Zeiss MultiSEM GmbH
    • Stefan Schubert
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Multi-beam charged particle system
    • Patent number 11,087,948
    • Issue date Aug 10, 2021
    • Carl Zeiss MultiSEM GmbH
    • Dirk Zeidler
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Multi-beam charged particle system
    • Patent number 10,741,355
    • Issue date Aug 11, 2020
    • Carl Zeiss MultiSEM GmbH
    • Dirk Zeidler
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Particle beam system
    • Patent number 10,600,613
    • Issue date Mar 24, 2020
    • Carl Zeiss Microscopy GmbH
    • Dirk Zeidler
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Particle beam system
    • Patent number 10,147,582
    • Issue date Dec 4, 2018
    • Carl Zeiss Microscopy GmbH
    • Dirk Zeidler
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Particle beam system
    • Patent number 9,552,957
    • Issue date Jan 24, 2017
    • Carl Zeiss Microscopy GmbH
    • Dirk Zeidler
    • H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents